Add test for ECP multiplication
The tests we had for ECP point multiplication were tailored for test
vectors symulating crypto operations and tested a series of operations
against public test vectors.
This commit adds a test function that exercises a single multiplication.
This is much better suited for negative testing than the preexisting
test.
Only one new test case is added that exercises a fraction of an existing
test, just to make sure that the test is consistent with the existing
test functions.
diff --git a/tests/suites/test_suite_ecp.function b/tests/suites/test_suite_ecp.function
index 7eeea28..03c3e53 100644
--- a/tests/suites/test_suite_ecp.function
+++ b/tests/suites/test_suite_ecp.function
@@ -675,6 +675,56 @@
/* END_CASE */
/* BEGIN_CASE */
+void ecp_test_mul( int id, data_t * n_hex,
+ data_t * Px_hex, data_t * Py_hex, data_t * Pz_hex,
+ data_t * nPx_hex, data_t * nPy_hex, data_t * nPz_hex,
+ int expected_ret )
+{
+ mbedtls_ecp_group grp;
+ mbedtls_ecp_point P, nP, R;
+ mbedtls_mpi n;
+ rnd_pseudo_info rnd_info;
+
+ mbedtls_ecp_group_init( &grp ); mbedtls_ecp_point_init( &R );
+ mbedtls_ecp_point_init( &P ); mbedtls_ecp_point_init( &nP );
+ mbedtls_mpi_init( &n );
+ memset( &rnd_info, 0x00, sizeof( rnd_pseudo_info ) );
+
+ TEST_ASSERT( mbedtls_ecp_group_load( &grp, id ) == 0 );
+
+ TEST_ASSERT( mbedtls_ecp_check_pubkey( &grp, &grp.G ) == 0 );
+
+ TEST_ASSERT( mbedtls_mpi_read_binary( &n, n_hex->x, n_hex->len ) == 0 );
+
+ TEST_ASSERT( mbedtls_mpi_read_binary( &P.X, Px_hex->x, Px_hex->len ) == 0 );
+ TEST_ASSERT( mbedtls_mpi_read_binary( &P.Y, Py_hex->x, Py_hex->len ) == 0 );
+ TEST_ASSERT( mbedtls_mpi_read_binary( &P.Z, Pz_hex->x, Pz_hex->len ) == 0 );
+ TEST_ASSERT( mbedtls_mpi_read_binary( &nP.X, nPx_hex->x, nPx_hex->len )
+ == 0 );
+ TEST_ASSERT( mbedtls_mpi_read_binary( &nP.Y, nPy_hex->x, nPy_hex->len )
+ == 0 );
+ TEST_ASSERT( mbedtls_mpi_read_binary( &nP.Z, nPz_hex->x, nPz_hex->len )
+ == 0 );
+
+ TEST_ASSERT( mbedtls_ecp_mul( &grp, &R, &n, &P,
+ &rnd_pseudo_rand, &rnd_info )
+ == expected_ret );
+
+ if( expected_ret == 0 )
+ {
+ TEST_ASSERT( mbedtls_mpi_cmp_mpi( &nP.X, &R.X ) == 0 );
+ TEST_ASSERT( mbedtls_mpi_cmp_mpi( &nP.Y, &R.Y ) == 0 );
+ TEST_ASSERT( mbedtls_mpi_cmp_mpi( &nP.Z, &R.Z ) == 0 );
+ }
+
+exit:
+ mbedtls_ecp_group_free( &grp ); mbedtls_ecp_point_free( &R );
+ mbedtls_ecp_point_free( &P ); mbedtls_ecp_point_free( &nP );
+ mbedtls_mpi_free( &n );
+}
+/* END_CASE */
+
+/* BEGIN_CASE */
void ecp_fast_mod( int id, char * N_str )
{
mbedtls_ecp_group grp;
