FreeRTOS/Demo/CORTEX_A53_64-bit_UltraScale_MPSoC/RTOSDemo_A53_bsp/psu_cortexa53_0/libsrc/standalone_v6_6/src/xil_testmem.c - third_party/github/FreeRTOS/FreeRTOS-Kernel - Git at Google

 /******************************************************************************
 *
 * Copyright (C) 2009 - 2015 Xilinx, Inc. All rights reserved.
 *
 * Permission is hereby granted, free of charge, to any person obtaining a copy
 * of this software and associated documentation files (the "Software"), to deal
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 * to use, copy, modify, merge, publish, distribute, sublicense, and/or sell
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 * furnished to do so, subject to the following conditions:
 *
 * The above copyright notice and this permission notice shall be included in
 * all copies or substantial portions of the Software.
 *
 * Use of the Software is limited solely to applications:
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 * IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
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 ******************************************************************************/
 /*****************************************************************************/
 /**
 *
 * @file xil_testmem.c
 *
 * Contains the memory test utility functions.
 *
 * <pre>
 * MODIFICATION HISTORY:
 *
 * Ver    Who    Date    Changes
 * ----- ---- -------- -----------------------------------------------
 * 1.00a hbm  08/25/09 First release
 * </pre>
 *
 *****************************************************************************/

 /***************************** Include Files ********************************/
 #include "xil_testmem.h"
 #include "xil_io.h"
 #include "xil_assert.h"

 /************************** Constant Definitions ****************************/
 /************************** Function Prototypes *****************************/

 static u32 RotateLeft(u32 Input, u8 Width);

 /* define ROTATE_RIGHT to give access to this functionality */
 /* #define ROTATE_RIGHT */
 #ifdef ROTATE_RIGHT
 static u32 RotateRight(u32 Input, u8 Width);
 #endif /* ROTATE_RIGHT */


 /*****************************************************************************/
 /**
 *
 * @brief    Perform a destructive 32-bit wide memory test.
 *
 * @param    Addr: pointer to the region of memory to be tested.
 * @param    Words: length of the block.
 * @param    Pattern: constant used for the constant pattern test, if 0,
 *           0xDEADBEEF is used.
 * @param    Subtest: test type selected. See xil_testmem.h for possible
 *	        values.
 *
 * @return
 *           - 0 is returned for a pass
 *           - 1 is returned for a failure
 *
 * @note
 * Used for spaces where the address range of the region is smaller than
 * the data width. If the memory range is greater than 2 ** Width,
 * the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
 * repeat on a boundry of a power of two making it more difficult to detect
 * addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
 * tests suffer the same problem. Ideally, if large blocks of memory are to be
 * tested, break them up into smaller regions of memory to allow the test
 * patterns used not to repeat over the region tested.
 *
 *****************************************************************************/
 s32 Xil_TestMem32(u32 *Addr, u32 Words, u32 Pattern, u8 Subtest)
 {
 	u32 I;
 	u32 j;
 	u32 Val;
 	u32 FirtVal;
 	u32 WordMem32;
 	s32 Status = 0;

 	Xil_AssertNonvoid(Words != (u32)0);
 	Xil_AssertNonvoid(Subtest <= (u8)XIL_TESTMEM_MAXTEST);
 	Xil_AssertNonvoid(Addr != NULL);

 	/*
 	 * variable initialization
 	 */
 	Val = XIL_TESTMEM_INIT_VALUE;
 	FirtVal = XIL_TESTMEM_INIT_VALUE;


 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INCREMENT)) {
 		/*
 		 * Fill the memory with incrementing
 		 * values starting from 'FirtVal'
 		 */
 		for (I = 0U; I < Words; I++) {
 			*(Addr+I) = Val;
 			Val++;
 		}

 		/*
 		 * Restore the reference 'Val' to the
 		 * initial value
 		 */
 		Val = FirtVal;

 		/*
 		 * Check every word within the words
 		 * of tested memory and compare it
 		 * with the incrementing reference
 		 * Val
 		 */

 		for (I = 0U; I < Words; I++) {
 			WordMem32 = *(Addr+I);

 			if (WordMem32 != Val) {
 				Status = -1;
 				goto End_Label;
 			}

 			Val++;
 		}
 	}

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKONES)) {
 		/*
 		 * set up to cycle through all possible initial
 		 * test Patterns for walking ones test
 		 */

 		for (j = 0U; j < (u32)32; j++) {
 			/*
 			 * Generate an initial value for walking ones test
 			 * to test for bad data bits
 			 */

 			Val = (1U << j);

 			/*
 			 * START walking ones test
 			 * Write a one to each data bit indifferent locations
 			 */

 			for (I = 0U; I < (u32)32; I++) {
 				/* write memory location */
 				*(Addr+I) = Val;
 				Val = (u32) RotateLeft(Val, 32U);
 			}

 			/*
 			 * Restore the reference 'val' to the
 			 * initial value
 			 */
 			Val = 1U << j;

 			/* Read the values from each location that was
 			 * written */
 			for (I = 0U; I < (u32)32; I++) {
 				/* read memory location */

 				WordMem32 = *(Addr+I);

 				if (WordMem32 != Val) {
 					Status = -1;
 					goto End_Label;
 				}

 				Val = (u32)RotateLeft(Val, 32U);
 			}
 		}
 	}

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKZEROS)) {
 		/*
 		 * set up to cycle through all possible
 		 * initial test Patterns for walking zeros test
 		 */

 		for (j = 0U; j < (u32)32; j++) {

 			/*
 			 * Generate an initial value for walking ones test
 			 * to test for bad data bits
 			 */

 			Val = ~(1U << j);

 			/*
 			 * START walking zeros test
 			 * Write a one to each data bit indifferent locations
 			 */

 			for (I = 0U; I < (u32)32; I++) {
 				/* write memory location */
 				*(Addr+I) = Val;
 				Val = ~((u32)RotateLeft(~Val, 32U));
 			}

 			/*
 			 * Restore the reference 'Val' to the
 			 * initial value
 			 */

 			Val = ~(1U << j);

 			/* Read the values from each location that was
 			 * written */
 			for (I = 0U; I < (u32)32; I++) {
 				/* read memory location */
 				WordMem32 = *(Addr+I);
 				if (WordMem32 != Val) {
 					Status = -1;
 					goto End_Label;
 				}
 				Val = ~((u32)RotateLeft(~Val, 32U));
 			}

 		}
 	}

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INVERSEADDR)) {
 		/* Fill the memory with inverse of address */
 		for (I = 0U; I < Words; I++) {
 			/* write memory location */
 			Val = (u32) (~((INTPTR) (&Addr[I])));
 			*(Addr+I) = Val;
 		}

 		/*
 		 * Check every word within the words
 		 * of tested memory
 		 */

 		for (I = 0U; I < Words; I++) {
 			/* Read the location */
 			WordMem32 = *(Addr+I);
 			Val = (u32) (~((INTPTR) (&Addr[I])));

 			if ((WordMem32 ^ Val) != 0x00000000U) {
 				Status = -1;
 				goto End_Label;
 			}
 		}
 	}

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
 		/*
 		 * Generate an initial value for
 		 * memory testing
 		 */

 		if (Pattern == (u32)0) {
 			Val = 0xDEADBEEFU;
 		}
 		else {
 			Val = Pattern;
 		}

 		/*
 		 * Fill the memory with fixed Pattern
 		 */

 		for (I = 0U; I < Words; I++) {
 			/* write memory location */
 			*(Addr+I) = Val;
 		}

 		/*
 		 * Check every word within the words
 		 * of tested memory and compare it
 		 * with the fixed Pattern
 		 */

 		for (I = 0U; I < Words; I++) {

 			/* read memory location */

 			WordMem32 = *(Addr+I);
 			if (WordMem32 != Val) {
 				Status = -1;
 				goto End_Label;
 			}
 		}
 	}

 End_Label:
 	return Status;
 }

 /*****************************************************************************/
 /**
 *
 * @brief    Perform a destructive 16-bit wide memory test.
 *
 * @param    Addr: pointer to the region of memory to be tested.
 * @param    Words: length of the block.
 * @param    Pattern: constant used for the constant Pattern test, if 0,
 *           0xDEADBEEF is used.
 * @param    Subtest: type of test selected. See xil_testmem.h for possible
 *	        values.
 *
 * @return
 *
 *           - -1 is returned for a failure
 *           - 0 is returned for a pass
 *
 * @note
 * Used for spaces where the address range of the region is smaller than
 * the data width. If the memory range is greater than 2 ** Width,
 * the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
 * repeat on a boundry of a power of two making it more difficult to detect
 * addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
 * tests suffer the same problem. Ideally, if large blocks of memory are to be
 * tested, break them up into smaller regions of memory to allow the test
 * patterns used not to repeat over the region tested.
 *
 *****************************************************************************/
 s32 Xil_TestMem16(u16 *Addr, u32 Words, u16 Pattern, u8 Subtest)
 {
 	u32 I;
 	u32 j;
 	u16 Val;
 	u16 FirtVal;
 	u16 WordMem16;
 	s32 Status = 0;

 	Xil_AssertNonvoid(Words != (u32)0);
 	Xil_AssertNonvoid(Subtest <= XIL_TESTMEM_MAXTEST);
 	Xil_AssertNonvoid(Addr != NULL);

 	/*
 	 * variable initialization
 	 */
 	Val = XIL_TESTMEM_INIT_VALUE;
 	FirtVal = XIL_TESTMEM_INIT_VALUE;

 	/*
 	 * selectthe proper Subtest(s)
 	 */

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INCREMENT)) {
 		/*
 		 * Fill the memory with incrementing
 		 * values starting from 'FirtVal'
 		 */
 		for (I = 0U; I < Words; I++) {
 			/* write memory location */
 			*(Addr+I) = Val;
 			Val++;
 		}
 		/*
 		 * Restore the reference 'Val' to the
 		 * initial value
 		 */
 		Val = FirtVal;

 		/*
 		 * Check every word within the words
 		 * of tested memory and compare it
 		 * with the incrementing reference val
 		 */

 		for (I = 0U; I < Words; I++) {
 			/* read memory location */
 			WordMem16 = *(Addr+I);
 			if (WordMem16 != Val) {
 				Status = -1;
 				goto End_Label;
 			}
 			Val++;
 		}
 	}

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKONES)) {
 		/*
 		 * set up to cycle through all possible initial test
 		 * Patterns for walking ones test
 		 */

 		for (j = 0U; j < (u32)16; j++) {
 			/*
 			 * Generate an initial value for walking ones test
 			 * to test for bad data bits
 			 */

 			Val = (u16)((u32)1 << j);
 			/*
 			 * START walking ones test
 			 * Write a one to each data bit indifferent locations
 			 */

 			for (I = 0U; I < (u32)16; I++) {
 				/* write memory location */
 				*(Addr+I) = Val;
 				Val = (u16)RotateLeft(Val, 16U);
 			}
 			/*
 			 * Restore the reference 'Val' to the
 			 * initial value
 			 */
 			Val = (u16)((u32)1 << j);
 			/* Read the values from each location that was written */
 			for (I = 0U; I < (u32)16; I++) {
 				/* read memory location */
 				WordMem16 = *(Addr+I);
 				if (WordMem16 != Val) {
 					Status = -1;
 					goto End_Label;
 				}
 				Val = (u16)RotateLeft(Val, 16U);
 			}
 		}
 	}

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKZEROS)) {
 		/*
 		 * set up to cycle through all possible initial
 		 * test Patterns for walking zeros test
 		 */

 		for (j = 0U; j < (u32)16; j++) {
 			/*
 			 * Generate an initial value for walking ones
 			 * test to test for bad
 			 * data bits
 			 */

 			Val = ~(1U << j);
 			/*
 			 * START walking zeros test
 			 * Write a one to each data bit indifferent locations
 			 */

 			for (I = 0U; I < (u32)16; I++) {
 				/* write memory location */
 				*(Addr+I) = Val;
 				Val = ~((u16)RotateLeft(~Val, 16U));
 			}
 			/*
 			 * Restore the reference 'Val' to the
 			 * initial value
 			 */
 			Val = ~(1U << j);
 			/* Read the values from each location that was written */
 			for (I = 0U; I < (u32)16; I++) {
 				/* read memory location */
 				WordMem16 = *(Addr+I);
 				if (WordMem16 != Val) {
 					Status = -1;
 					goto End_Label;
 				}
 				Val = ~((u16)RotateLeft(~Val, 16U));
 			}

 		}
 	}

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INVERSEADDR)) {
 		/* Fill the memory with inverse of address */
 		for (I = 0U; I < Words; I++) {
 			/* write memory location */
 			Val = (u16) (~((INTPTR)(&Addr[I])));
 			*(Addr+I) = Val;
 		}
 		/*
 		 * Check every word within the words
 		 * of tested memory
 		 */

 		for (I = 0U; I < Words; I++) {
 			/* read memory location */
 			WordMem16 = *(Addr+I);
 			Val = (u16) (~((INTPTR) (&Addr[I])));
 			if ((WordMem16 ^ Val) != 0x0000U) {
 				Status = -1;
 				goto End_Label;
 			}
 		}
 	}

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
 		/*
 		 * Generate an initial value for
 		 * memory testing
 		 */
 		if (Pattern == (u16)0) {
 			Val = 0xDEADU;
 		}
 		else {
 			Val = Pattern;
 		}

 		/*
 		 * Fill the memory with fixed pattern
 		 */

 		for (I = 0U; I < Words; I++) {
 			/* write memory location */
 			*(Addr+I) = Val;
 		}

 		/*
 		 * Check every word within the words
 		 * of tested memory and compare it
 		 * with the fixed pattern
 		 */

 		for (I = 0U; I < Words; I++) {
 			/* read memory location */
 			WordMem16 = *(Addr+I);
 			if (WordMem16 != Val) {
 				Status = -1;
 				goto End_Label;
 			}
 		}
 	}

 End_Label:
 	return Status;
 }


 /*****************************************************************************/
 /**
 *
 * @brief    Perform a destructive 8-bit wide memory test.
 *
 * @param    Addr: pointer to the region of memory to be tested.
 * @param    Words: length of the block.
 * @param    Pattern: constant used for the constant pattern test, if 0,
 *           0xDEADBEEF is used.
 * @param    Subtest: type of test selected. See xil_testmem.h for possible
 *	        values.
 *
 * @return
 *           - -1 is returned for a failure
 *           - 0 is returned for a pass
 *
 * @note
 * Used for spaces where the address range of the region is smaller than
 * the data width. If the memory range is greater than 2 ** Width,
 * the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
 * repeat on a boundry of a power of two making it more difficult to detect
 * addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
 * tests suffer the same problem. Ideally, if large blocks of memory are to be
 * tested, break them up into smaller regions of memory to allow the test
 * patterns used not to repeat over the region tested.
 *
 *****************************************************************************/
 s32 Xil_TestMem8(u8 *Addr, u32 Words, u8 Pattern, u8 Subtest)
 {
 	u32 I;
 	u32 j;
 	u8 Val;
 	u8 FirtVal;
 	u8 WordMem8;
 	s32 Status = 0;

 	Xil_AssertNonvoid(Words != (u32)0);
 	Xil_AssertNonvoid(Subtest <= XIL_TESTMEM_MAXTEST);
 	Xil_AssertNonvoid(Addr != NULL);

 	/*
 	 * variable initialization
 	 */
 	Val = XIL_TESTMEM_INIT_VALUE;
 	FirtVal = XIL_TESTMEM_INIT_VALUE;

 	/*
 	 * select the proper Subtest(s)
 	 */

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INCREMENT)) {
 		/*
 		 * Fill the memory with incrementing
 		 * values starting from 'FirtVal'
 		 */
 		for (I = 0U; I < Words; I++) {
 			/* write memory location */
 			*(Addr+I) = Val;
 			Val++;
 		}
 		/*
 		 * Restore the reference 'Val' to the
 		 * initial value
 		 */
 		Val = FirtVal;
 		/*
 		 * Check every word within the words
 		 * of tested memory and compare it
 		 * with the incrementing reference
 		 * Val
 		 */

 		for (I = 0U; I < Words; I++) {
 			/* read memory location */
 			WordMem8 = *(Addr+I);
 			if (WordMem8 != Val) {
 				Status = -1;
 				goto End_Label;
 			}
 			Val++;
 		}
 	}

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKONES)) {
 		/*
 		 * set up to cycle through all possible initial
 		 * test Patterns for walking ones test
 		 */

 		for (j = 0U; j < (u32)8; j++) {
 			/*
 			 * Generate an initial value for walking ones test
 			 * to test for bad data bits
 			 */
 			Val = (u8)((u32)1 << j);
 			/*
 			 * START walking ones test
 			 * Write a one to each data bit indifferent locations
 			 */
 			for (I = 0U; I < (u32)8; I++) {
 				/* write memory location */
 				*(Addr+I) = Val;
 				Val = (u8)RotateLeft(Val, 8U);
 			}
 			/*
 			 * Restore the reference 'Val' to the
 			 * initial value
 			 */
 			Val = (u8)((u32)1 << j);
 			/* Read the values from each location that was written */
 			for (I = 0U; I < (u32)8; I++) {
 				/* read memory location */
 				WordMem8 = *(Addr+I);
 				if (WordMem8 != Val) {
 					Status = -1;
 					goto End_Label;
 				}
 				Val = (u8)RotateLeft(Val, 8U);
 			}
 		}
 	}

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKZEROS)) {
 		/*
 		 * set up to cycle through all possible initial test
 		 * Patterns for walking zeros test
 		 */

 		for (j = 0U; j < (u32)8; j++) {
 			/*
 			 * Generate an initial value for walking ones test to test
 			 * for bad data bits
 			 */
 			Val = ~(1U << j);
 			/*
 			 * START walking zeros test
 			 * Write a one to each data bit indifferent locations
 			 */
 			for (I = 0U; I < (u32)8; I++) {
 				/* write memory location */
 				*(Addr+I) = Val;
 				Val = ~((u8)RotateLeft(~Val, 8U));
 			}
 			/*
 			 * Restore the reference 'Val' to the
 			 * initial value
 			 */
 			Val = ~(1U << j);
 			/* Read the values from each location that was written */
 			for (I = 0U; I < (u32)8; I++) {
 				/* read memory location */
 				WordMem8 = *(Addr+I);
 				if (WordMem8 != Val) {
 					Status = -1;
 					goto End_Label;
 				}

 				Val = ~((u8)RotateLeft(~Val, 8U));
 			}
 		}
 	}

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INVERSEADDR)) {
 		/* Fill the memory with inverse of address */
 		for (I = 0U; I < Words; I++) {
 			/* write memory location */
 			Val = (u8) (~((INTPTR) (&Addr[I])));
 			*(Addr+I) = Val;
 		}

 		/*
 		 * Check every word within the words
 		 * of tested memory
 		 */

 		for (I = 0U; I < Words; I++) {
 			/* read memory location */
 			WordMem8 = *(Addr+I);
 			Val = (u8) (~((INTPTR) (&Addr[I])));
 			if ((WordMem8 ^ Val) != 0x00U) {
 				Status = -1;
 				goto End_Label;
 			}
 		}
 	}

 	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
 		/*
 		 * Generate an initial value for
 		 * memory testing
 		 */

 		if (Pattern == (u8)0) {
 			Val = 0xA5U;
 		}
 		else {
 			Val = Pattern;
 		}
 		/*
 		 * Fill the memory with fixed Pattern
 		 */
 		for (I = 0U; I < Words; I++) {
 			/* write memory location */
 			*(Addr+I) = Val;
 		}
 		/*
 		 * Check every word within the words
 		 * of tested memory and compare it
 		 * with the fixed Pattern
 		 */

 		for (I = 0U; I < Words; I++) {
 			/* read memory location */
 			WordMem8 = *(Addr+I);
 			if (WordMem8 != Val) {
 				Status = -1;
 				goto End_Label;
 			}
 		}
 	}

 End_Label:
 	return Status;
 }


 /*****************************************************************************/
 /**
 *
 * @brief   Rotates the provided value to the left one bit position
 *
 * @param    Input is value to be rotated to the left
 * @param    Width is the number of bits in the input data
 *
 * @return
 *           The resulting unsigned long value of the rotate left
 *
 *
 *****************************************************************************/
 static u32 RotateLeft(u32 Input, u8 Width)
 {
 	u32 Msb;
 	u32 ReturnVal;
 	u32 WidthMask;
 	u32 MsbMask;
 	u32 LocalInput = Input;

 	/*
 	 * set up the WidthMask and the MsbMask
 	 */

 	MsbMask = 1U << (Width - 1U);

 	WidthMask = (MsbMask << (u32)1) - (u32)1;

 	/*
 	 * set the Width of the Input to the correct width
 	 */

 	LocalInput = LocalInput & WidthMask;

 	Msb = LocalInput & MsbMask;

 	ReturnVal = LocalInput << 1U;

 	if (Msb != 0x00000000U) {
 		ReturnVal = ReturnVal | (u32)0x00000001;
 	}

 	ReturnVal = ReturnVal & WidthMask;

 	return ReturnVal;

 }

 #ifdef ROTATE_RIGHT
 /*****************************************************************************/
 /**
 *
 * @brief    Rotates the provided value to the right one bit position
 *
 * @param    Input: value to be rotated to the right
 * @param    Width: number of bits in the input data
 *
 * @return
 *           The resulting u32 value of the rotate right
 *
 *****************************************************************************/
 static u32 RotateRight(u32 Input, u8 Width)
 {
 	u32 Lsb;
 	u32 ReturnVal;
 	u32 WidthMask;
 	u32 MsbMask;
 	u32 LocalInput = Input;
 	/*
 	 * set up the WidthMask and the MsbMask
 	 */

 	MsbMask = 1U << (Width - 1U);

 	WidthMask = (MsbMask << 1U) - 1U;

 	/*
 	 * set the width of the input to the correct width
 	 */

 	LocalInput = LocalInput & WidthMask;

 	ReturnVal = LocalInput >> 1U;

 	Lsb = LocalInput & 0x00000001U;

 	if (Lsb != 0x00000000U) {
 		ReturnVal = ReturnVal | MsbMask;
 	}

 	ReturnVal = ReturnVal & WidthMask;

 	return ReturnVal;

 }
 #endif /* ROTATE_RIGHT */
	/******************************************************************************
	*
	* Copyright (C) 2009 - 2015 Xilinx, Inc. All rights reserved.
	*
	* Permission is hereby granted, free of charge, to any person obtaining a copy
	* of this software and associated documentation files (the "Software"), to deal
	* in the Software without restriction, including without limitation the rights
	* to use, copy, modify, merge, publish, distribute, sublicense, and/or sell
	* copies of the Software, and to permit persons to whom the Software is
	* furnished to do so, subject to the following conditions:
	*
	* The above copyright notice and this permission notice shall be included in
	* all copies or substantial portions of the Software.
	*
	* Use of the Software is limited solely to applications:
	* (a) running on a Xilinx device, or
	* (b) that interact with a Xilinx device through a bus or interconnect.
	*
	* THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR
	* IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
	* FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL
	* XILINX BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER LIABILITY,
	* WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, OUT OF
	* OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE
	* SOFTWARE.
	*
	* Except as contained in this notice, the name of the Xilinx shall not be used
	* in advertising or otherwise to promote the sale, use or other dealings in
	* this Software without prior written authorization from Xilinx.
	*
	******************************************************************************/
	/*****************************************************************************/
	/**
	*
	* @file xil_testmem.c
	*
	* Contains the memory test utility functions.
	*
	* <pre>
	* MODIFICATION HISTORY:
	*
	* Ver Who Date Changes
	* ----- ---- -------- -----------------------------------------------
	* 1.00a hbm 08/25/09 First release
	* </pre>
	*
	*****************************************************************************/

	/*************************** Include Files ******************************/
	#include "xil_testmem.h"
	#include "xil_io.h"
	#include "xil_assert.h"

	/************************ Constant Definitions **************************/
	/************************ Function Prototypes ***************************/

	static u32 RotateLeft(u32 Input, u8 Width);

	/* define ROTATE_RIGHT to give access to this functionality */
	/* #define ROTATE_RIGHT */
	#ifdef ROTATE_RIGHT
	static u32 RotateRight(u32 Input, u8 Width);
	#endif /* ROTATE_RIGHT */


	/*****************************************************************************/
	/**
	*
	* @brief Perform a destructive 32-bit wide memory test.
	*
	* @param Addr: pointer to the region of memory to be tested.
	* @param Words: length of the block.
	* @param Pattern: constant used for the constant pattern test, if 0,
	* 0xDEADBEEF is used.
	* @param Subtest: test type selected. See xil_testmem.h for possible
	* values.
	*
	* @return
	* - 0 is returned for a pass
	* - 1 is returned for a failure
	*
	* @note
	* Used for spaces where the address range of the region is smaller than
	* the data width. If the memory range is greater than 2 ** Width,
	* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
	* repeat on a boundry of a power of two making it more difficult to detect
	* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
	* tests suffer the same problem. Ideally, if large blocks of memory are to be
	* tested, break them up into smaller regions of memory to allow the test
	* patterns used not to repeat over the region tested.
	*
	*****************************************************************************/
	s32 Xil_TestMem32(u32 *Addr, u32 Words, u32 Pattern, u8 Subtest)
	{
	u32 I;
	u32 j;
	u32 Val;
	u32 FirtVal;
	u32 WordMem32;
	s32 Status = 0;

	Xil_AssertNonvoid(Words != (u32)0);
	Xil_AssertNonvoid(Subtest <= (u8)XIL_TESTMEM_MAXTEST);
	Xil_AssertNonvoid(Addr != NULL);

	/*
	* variable initialization
	*/
	Val = XIL_TESTMEM_INIT_VALUE;
	FirtVal = XIL_TESTMEM_INIT_VALUE;


	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_INCREMENT)) {
	/*
	* Fill the memory with incrementing
	* values starting from 'FirtVal'
	*/
	for (I = 0U; I < Words; I++) {
	*(Addr+I) = Val;
	Val++;
	}

	/*
	* Restore the reference 'Val' to the
	* initial value
	*/
	Val = FirtVal;

	/*
	* Check every word within the words
	* of tested memory and compare it
	* with the incrementing reference
	* Val
	*/

	for (I = 0U; I < Words; I++) {
	WordMem32 = *(Addr+I);

	if (WordMem32 != Val) {
	Status = -1;
	goto End_Label;
	}

	Val++;
	}
	}

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_WALKONES)) {
	/*
	* set up to cycle through all possible initial
	* test Patterns for walking ones test
	*/

	for (j = 0U; j < (u32)32; j++) {
	/*
	* Generate an initial value for walking ones test
	* to test for bad data bits
	*/

	Val = (1U << j);

	/*
	* START walking ones test
	* Write a one to each data bit indifferent locations
	*/

	for (I = 0U; I < (u32)32; I++) {
	/* write memory location */
	*(Addr+I) = Val;
	Val = (u32) RotateLeft(Val, 32U);
	}

	/*
	* Restore the reference 'val' to the
	* initial value
	*/
	Val = 1U << j;

	/* Read the values from each location that was
	* written */
	for (I = 0U; I < (u32)32; I++) {
	/* read memory location */

	WordMem32 = *(Addr+I);

	if (WordMem32 != Val) {
	Status = -1;
	goto End_Label;
	}

	Val = (u32)RotateLeft(Val, 32U);
	}
	}
	}

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_WALKZEROS)) {
	/*
	* set up to cycle through all possible
	* initial test Patterns for walking zeros test
	*/

	for (j = 0U; j < (u32)32; j++) {

	/*
	* Generate an initial value for walking ones test
	* to test for bad data bits
	*/

	Val = ~(1U << j);

	/*
	* START walking zeros test
	* Write a one to each data bit indifferent locations
	*/

	for (I = 0U; I < (u32)32; I++) {
	/* write memory location */
	*(Addr+I) = Val;
	Val = ~((u32)RotateLeft(~Val, 32U));
	}

	/*
	* Restore the reference 'Val' to the
	* initial value
	*/

	Val = ~(1U << j);

	/* Read the values from each location that was
	* written */
	for (I = 0U; I < (u32)32; I++) {
	/* read memory location */
	WordMem32 = *(Addr+I);
	if (WordMem32 != Val) {
	Status = -1;
	goto End_Label;
	}
	Val = ~((u32)RotateLeft(~Val, 32U));
	}

	}
	}

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_INVERSEADDR)) {
	/* Fill the memory with inverse of address */
	for (I = 0U; I < Words; I++) {
	/* write memory location */
	Val = (u32) (~((INTPTR) (&Addr[I])));
	*(Addr+I) = Val;
	}

	/*
	* Check every word within the words
	* of tested memory
	*/

	for (I = 0U; I < Words; I++) {
	/* Read the location */
	WordMem32 = *(Addr+I);
	Val = (u32) (~((INTPTR) (&Addr[I])));

	if ((WordMem32 ^ Val) != 0x00000000U) {
	Status = -1;
	goto End_Label;
	}
	}
	}

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
	/*
	* Generate an initial value for
	* memory testing
	*/

	if (Pattern == (u32)0) {
	Val = 0xDEADBEEFU;
	}
	else {
	Val = Pattern;
	}

	/*
	* Fill the memory with fixed Pattern
	*/

	for (I = 0U; I < Words; I++) {
	/* write memory location */
	*(Addr+I) = Val;
	}

	/*
	* Check every word within the words
	* of tested memory and compare it
	* with the fixed Pattern
	*/

	for (I = 0U; I < Words; I++) {

	/* read memory location */

	WordMem32 = *(Addr+I);
	if (WordMem32 != Val) {
	Status = -1;
	goto End_Label;
	}
	}
	}

	End_Label:
	return Status;
	}

	/*****************************************************************************/
	/**
	*
	* @brief Perform a destructive 16-bit wide memory test.
	*
	* @param Addr: pointer to the region of memory to be tested.
	* @param Words: length of the block.
	* @param Pattern: constant used for the constant Pattern test, if 0,
	* 0xDEADBEEF is used.
	* @param Subtest: type of test selected. See xil_testmem.h for possible
	* values.
	*
	* @return
	*
	* - -1 is returned for a failure
	* - 0 is returned for a pass
	*
	* @note
	* Used for spaces where the address range of the region is smaller than
	* the data width. If the memory range is greater than 2 ** Width,
	* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
	* repeat on a boundry of a power of two making it more difficult to detect
	* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
	* tests suffer the same problem. Ideally, if large blocks of memory are to be
	* tested, break them up into smaller regions of memory to allow the test
	* patterns used not to repeat over the region tested.
	*
	*****************************************************************************/
	s32 Xil_TestMem16(u16 *Addr, u32 Words, u16 Pattern, u8 Subtest)
	{
	u32 I;
	u32 j;
	u16 Val;
	u16 FirtVal;
	u16 WordMem16;
	s32 Status = 0;

	Xil_AssertNonvoid(Words != (u32)0);
	Xil_AssertNonvoid(Subtest <= XIL_TESTMEM_MAXTEST);
	Xil_AssertNonvoid(Addr != NULL);

	/*
	* variable initialization
	*/
	Val = XIL_TESTMEM_INIT_VALUE;
	FirtVal = XIL_TESTMEM_INIT_VALUE;

	/*
	* selectthe proper Subtest(s)
	*/

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_INCREMENT)) {
	/*
	* Fill the memory with incrementing
	* values starting from 'FirtVal'
	*/
	for (I = 0U; I < Words; I++) {
	/* write memory location */
	*(Addr+I) = Val;
	Val++;
	}
	/*
	* Restore the reference 'Val' to the
	* initial value
	*/
	Val = FirtVal;

	/*
	* Check every word within the words
	* of tested memory and compare it
	* with the incrementing reference val
	*/

	for (I = 0U; I < Words; I++) {
	/* read memory location */
	WordMem16 = *(Addr+I);
	if (WordMem16 != Val) {
	Status = -1;
	goto End_Label;
	}
	Val++;
	}
	}

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_WALKONES)) {
	/*
	* set up to cycle through all possible initial test
	* Patterns for walking ones test
	*/

	for (j = 0U; j < (u32)16; j++) {
	/*
	* Generate an initial value for walking ones test
	* to test for bad data bits
	*/

	Val = (u16)((u32)1 << j);
	/*
	* START walking ones test
	* Write a one to each data bit indifferent locations
	*/

	for (I = 0U; I < (u32)16; I++) {
	/* write memory location */
	*(Addr+I) = Val;
	Val = (u16)RotateLeft(Val, 16U);
	}
	/*
	* Restore the reference 'Val' to the
	* initial value
	*/
	Val = (u16)((u32)1 << j);
	/* Read the values from each location that was written */
	for (I = 0U; I < (u32)16; I++) {
	/* read memory location */
	WordMem16 = *(Addr+I);
	if (WordMem16 != Val) {
	Status = -1;
	goto End_Label;
	}
	Val = (u16)RotateLeft(Val, 16U);
	}
	}
	}

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_WALKZEROS)) {
	/*
	* set up to cycle through all possible initial
	* test Patterns for walking zeros test
	*/

	for (j = 0U; j < (u32)16; j++) {
	/*
	* Generate an initial value for walking ones
	* test to test for bad
	* data bits
	*/

	Val = ~(1U << j);
	/*
	* START walking zeros test
	* Write a one to each data bit indifferent locations
	*/

	for (I = 0U; I < (u32)16; I++) {
	/* write memory location */
	*(Addr+I) = Val;
	Val = ~((u16)RotateLeft(~Val, 16U));
	}
	/*
	* Restore the reference 'Val' to the
	* initial value
	*/
	Val = ~(1U << j);
	/* Read the values from each location that was written */
	for (I = 0U; I < (u32)16; I++) {
	/* read memory location */
	WordMem16 = *(Addr+I);
	if (WordMem16 != Val) {
	Status = -1;
	goto End_Label;
	}
	Val = ~((u16)RotateLeft(~Val, 16U));
	}

	}
	}

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_INVERSEADDR)) {
	/* Fill the memory with inverse of address */
	for (I = 0U; I < Words; I++) {
	/* write memory location */
	Val = (u16) (~((INTPTR)(&Addr[I])));
	*(Addr+I) = Val;
	}
	/*
	* Check every word within the words
	* of tested memory
	*/

	for (I = 0U; I < Words; I++) {
	/* read memory location */
	WordMem16 = *(Addr+I);
	Val = (u16) (~((INTPTR) (&Addr[I])));
	if ((WordMem16 ^ Val) != 0x0000U) {
	Status = -1;
	goto End_Label;
	}
	}
	}

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
	/*
	* Generate an initial value for
	* memory testing
	*/
	if (Pattern == (u16)0) {
	Val = 0xDEADU;
	}
	else {
	Val = Pattern;
	}

	/*
	* Fill the memory with fixed pattern
	*/

	for (I = 0U; I < Words; I++) {
	/* write memory location */
	*(Addr+I) = Val;
	}

	/*
	* Check every word within the words
	* of tested memory and compare it
	* with the fixed pattern
	*/

	for (I = 0U; I < Words; I++) {
	/* read memory location */
	WordMem16 = *(Addr+I);
	if (WordMem16 != Val) {
	Status = -1;
	goto End_Label;
	}
	}
	}

	End_Label:
	return Status;
	}


	/*****************************************************************************/
	/**
	*
	* @brief Perform a destructive 8-bit wide memory test.
	*
	* @param Addr: pointer to the region of memory to be tested.
	* @param Words: length of the block.
	* @param Pattern: constant used for the constant pattern test, if 0,
	* 0xDEADBEEF is used.
	* @param Subtest: type of test selected. See xil_testmem.h for possible
	* values.
	*
	* @return
	* - -1 is returned for a failure
	* - 0 is returned for a pass
	*
	* @note
	* Used for spaces where the address range of the region is smaller than
	* the data width. If the memory range is greater than 2 ** Width,
	* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
	* repeat on a boundry of a power of two making it more difficult to detect
	* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
	* tests suffer the same problem. Ideally, if large blocks of memory are to be
	* tested, break them up into smaller regions of memory to allow the test
	* patterns used not to repeat over the region tested.
	*
	*****************************************************************************/
	s32 Xil_TestMem8(u8 *Addr, u32 Words, u8 Pattern, u8 Subtest)
	{
	u32 I;
	u32 j;
	u8 Val;
	u8 FirtVal;
	u8 WordMem8;
	s32 Status = 0;

	Xil_AssertNonvoid(Words != (u32)0);
	Xil_AssertNonvoid(Subtest <= XIL_TESTMEM_MAXTEST);
	Xil_AssertNonvoid(Addr != NULL);

	/*
	* variable initialization
	*/
	Val = XIL_TESTMEM_INIT_VALUE;
	FirtVal = XIL_TESTMEM_INIT_VALUE;

	/*
	* select the proper Subtest(s)
	*/

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_INCREMENT)) {
	/*
	* Fill the memory with incrementing
	* values starting from 'FirtVal'
	*/
	for (I = 0U; I < Words; I++) {
	/* write memory location */
	*(Addr+I) = Val;
	Val++;
	}
	/*
	* Restore the reference 'Val' to the
	* initial value
	*/
	Val = FirtVal;
	/*
	* Check every word within the words
	* of tested memory and compare it
	* with the incrementing reference
	* Val
	*/

	for (I = 0U; I < Words; I++) {
	/* read memory location */
	WordMem8 = *(Addr+I);
	if (WordMem8 != Val) {
	Status = -1;
	goto End_Label;
	}
	Val++;
	}
	}

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_WALKONES)) {
	/*
	* set up to cycle through all possible initial
	* test Patterns for walking ones test
	*/

	for (j = 0U; j < (u32)8; j++) {
	/*
	* Generate an initial value for walking ones test
	* to test for bad data bits
	*/
	Val = (u8)((u32)1 << j);
	/*
	* START walking ones test
	* Write a one to each data bit indifferent locations
	*/
	for (I = 0U; I < (u32)8; I++) {
	/* write memory location */
	*(Addr+I) = Val;
	Val = (u8)RotateLeft(Val, 8U);
	}
	/*
	* Restore the reference 'Val' to the
	* initial value
	*/
	Val = (u8)((u32)1 << j);
	/* Read the values from each location that was written */
	for (I = 0U; I < (u32)8; I++) {
	/* read memory location */
	WordMem8 = *(Addr+I);
	if (WordMem8 != Val) {
	Status = -1;
	goto End_Label;
	}
	Val = (u8)RotateLeft(Val, 8U);
	}
	}
	}

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_WALKZEROS)) {
	/*
	* set up to cycle through all possible initial test
	* Patterns for walking zeros test
	*/

	for (j = 0U; j < (u32)8; j++) {
	/*
	* Generate an initial value for walking ones test to test
	* for bad data bits
	*/
	Val = ~(1U << j);
	/*
	* START walking zeros test
	* Write a one to each data bit indifferent locations
	*/
	for (I = 0U; I < (u32)8; I++) {
	/* write memory location */
	*(Addr+I) = Val;
	Val = ~((u8)RotateLeft(~Val, 8U));
	}
	/*
	* Restore the reference 'Val' to the
	* initial value
	*/
	Val = ~(1U << j);
	/* Read the values from each location that was written */
	for (I = 0U; I < (u32)8; I++) {
	/* read memory location */
	WordMem8 = *(Addr+I);
	if (WordMem8 != Val) {
	Status = -1;
	goto End_Label;
	}

	Val = ~((u8)RotateLeft(~Val, 8U));
	}
	}
	}

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_INVERSEADDR)) {
	/* Fill the memory with inverse of address */
	for (I = 0U; I < Words; I++) {
	/* write memory location */
	Val = (u8) (~((INTPTR) (&Addr[I])));
	*(Addr+I) = Val;
	}

	/*
	* Check every word within the words
	* of tested memory
	*/

	for (I = 0U; I < Words; I++) {
	/* read memory location */
	WordMem8 = *(Addr+I);
	Val = (u8) (~((INTPTR) (&Addr[I])));
	if ((WordMem8 ^ Val) != 0x00U) {
	Status = -1;
	goto End_Label;
	}
	}
	}

	if((Subtest == XIL_TESTMEM_ALLMEMTESTS) \|\| (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
	/*
	* Generate an initial value for
	* memory testing
	*/

	if (Pattern == (u8)0) {
	Val = 0xA5U;
	}
	else {
	Val = Pattern;
	}
	/*
	* Fill the memory with fixed Pattern
	*/
	for (I = 0U; I < Words; I++) {
	/* write memory location */
	*(Addr+I) = Val;
	}
	/*
	* Check every word within the words
	* of tested memory and compare it
	* with the fixed Pattern
	*/

	for (I = 0U; I < Words; I++) {
	/* read memory location */
	WordMem8 = *(Addr+I);
	if (WordMem8 != Val) {
	Status = -1;
	goto End_Label;
	}
	}
	}

	End_Label:
	return Status;
	}


	/*****************************************************************************/
	/**
	*
	* @brief Rotates the provided value to the left one bit position
	*
	* @param Input is value to be rotated to the left
	* @param Width is the number of bits in the input data
	*
	* @return
	* The resulting unsigned long value of the rotate left
	*
	*
	*****************************************************************************/
	static u32 RotateLeft(u32 Input, u8 Width)
	{
	u32 Msb;
	u32 ReturnVal;
	u32 WidthMask;
	u32 MsbMask;
	u32 LocalInput = Input;

	/*
	* set up the WidthMask and the MsbMask
	*/

	MsbMask = 1U << (Width - 1U);

	WidthMask = (MsbMask << (u32)1) - (u32)1;

	/*
	* set the Width of the Input to the correct width
	*/

	LocalInput = LocalInput & WidthMask;

	Msb = LocalInput & MsbMask;

	ReturnVal = LocalInput << 1U;

	if (Msb != 0x00000000U) {
	ReturnVal = ReturnVal \| (u32)0x00000001;
	}

	ReturnVal = ReturnVal & WidthMask;

	return ReturnVal;

	}

	#ifdef ROTATE_RIGHT
	/*****************************************************************************/
	/**
	*
	* @brief Rotates the provided value to the right one bit position
	*
	* @param Input: value to be rotated to the right
	* @param Width: number of bits in the input data
	*
	* @return
	* The resulting u32 value of the rotate right
	*
	*****************************************************************************/
	static u32 RotateRight(u32 Input, u8 Width)
	{
	u32 Lsb;
	u32 ReturnVal;
	u32 WidthMask;
	u32 MsbMask;
	u32 LocalInput = Input;
	/*
	* set up the WidthMask and the MsbMask
	*/

	MsbMask = 1U << (Width - 1U);

	WidthMask = (MsbMask << 1U) - 1U;

	/*
	* set the width of the input to the correct width
	*/

	LocalInput = LocalInput & WidthMask;

	ReturnVal = LocalInput >> 1U;

	Lsb = LocalInput & 0x00000001U;

	if (Lsb != 0x00000000U) {
	ReturnVal = ReturnVal \| MsbMask;
	}

	ReturnVal = ReturnVal & WidthMask;

	return ReturnVal;

	}
	#endif /* ROTATE_RIGHT */