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| /** |
| * |
| * @file xil_testmem.h |
| * @addtogroup common_test_utils |
| * |
| * <h2>Memory test</h2> |
| * |
| * The xil_testmem.h file contains utility functions to test memory. |
| * A subset of the memory tests can be selected or all of the tests can be run |
| * in order. If there is an error detected by a subtest, the test stops and the |
| * failure code is returned. Further tests are not run even if all of the tests |
| * are selected. |
| * Following list describes the supported memory tests: |
| * |
| * - XIL_TESTMEM_ALLMEMTESTS: This test runs all of the subtests. |
| * |
| * - XIL_TESTMEM_INCREMENT: This test |
| * starts at 'XIL_TESTMEM_INIT_VALUE' and uses the incrementing value as the |
| * test value for memory. |
| * |
| * - XIL_TESTMEM_WALKONES: Also known as the Walking ones test. This test |
| * uses a walking '1' as the test value for memory. |
| * @code |
| * location 1 = 0x00000001 |
| * location 2 = 0x00000002 |
| * ... |
| * @endcode |
| * |
| * - XIL_TESTMEM_WALKZEROS: Also known as the Walking zero's test. |
| * This test uses the inverse value of the walking ones test |
| * as the test value for memory. |
| * @code |
| * location 1 = 0xFFFFFFFE |
| * location 2 = 0xFFFFFFFD |
| * ... |
| *@endcode |
| * |
| * - XIL_TESTMEM_INVERSEADDR: Also known as the inverse address test. |
| * This test uses the inverse of the address of the location under test |
| * as the test value for memory. |
| * |
| * - XIL_TESTMEM_FIXEDPATTERN: Also known as the fixed pattern test. |
| * This test uses the provided patters as the test value for memory. |
| * If zero is provided as the pattern the test uses '0xDEADBEEF". |
| * |
| * @warning |
| * The tests are <b>DESTRUCTIVE</b>. Run before any initialized memory spaces |
| * have been set up. |
| * The address provided to the memory tests is not checked for |
| * validity except for the NULL case. It is possible to provide a code-space |
| * pointer for this test to start with and ultimately destroy executable code |
| * causing random failures. |
| * |
| * @note |
| * Used for spaces where the address range of the region is smaller than |
| * the data width. If the memory range is greater than 2 ** width, |
| * the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will |
| * repeat on a boundry of a power of two making it more difficult to detect |
| * addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR |
| * tests suffer the same problem. Ideally, if large blocks of memory are to be |
| * tested, break them up into smaller regions of memory to allow the test |
| * patterns used not to repeat over the region tested. |
| * |
| * <pre> |
| * MODIFICATION HISTORY: |
| * |
| * Ver Who Date Changes |
| * ----- ---- -------- ----------------------------------------------- |
| * 1.00a hbm 08/25/09 First release |
| * </pre> |
| * |
| ******************************************************************************/ |
| |
| #ifndef XIL_TESTMEM_H /* prevent circular inclusions */ |
| #define XIL_TESTMEM_H /* by using protection macros */ |
| |
| #ifdef __cplusplus |
| extern "C" { |
| #endif |
| |
| /***************************** Include Files *********************************/ |
| #include "xil_types.h" |
| |
| /************************** Constant Definitions *****************************/ |
| |
| |
| /**************************** Type Definitions *******************************/ |
| |
| /* xutil_memtest defines */ |
| |
| #define XIL_TESTMEM_INIT_VALUE 1U |
| |
| /** @name Memory subtests |
| * @{ |
| */ |
| /** |
| * See the detailed description of the subtests in the file description. |
| */ |
| #define XIL_TESTMEM_ALLMEMTESTS 0x00U |
| #define XIL_TESTMEM_INCREMENT 0x01U |
| #define XIL_TESTMEM_WALKONES 0x02U |
| #define XIL_TESTMEM_WALKZEROS 0x03U |
| #define XIL_TESTMEM_INVERSEADDR 0x04U |
| #define XIL_TESTMEM_FIXEDPATTERN 0x05U |
| #define XIL_TESTMEM_MAXTEST XIL_TESTMEM_FIXEDPATTERN |
| /* @} */ |
| |
| /***************** Macros (Inline Functions) Definitions *********************/ |
| |
| |
| /************************** Function Prototypes ******************************/ |
| |
| /* xutil_testmem prototypes */ |
| |
| extern s32 Xil_TestMem32(u32 *Addr, u32 Words, u32 Pattern, u8 Subtest); |
| extern s32 Xil_TestMem16(u16 *Addr, u32 Words, u16 Pattern, u8 Subtest); |
| extern s32 Xil_TestMem8(u8 *Addr, u32 Words, u8 Pattern, u8 Subtest); |
| |
| #ifdef __cplusplus |
| } |
| #endif |
| |
| #endif /* end of protection macro */ |
| /** |
| * @} End of "addtogroup common_test_utils". |
| */ |
