Fix for #148

examples/ecc_test/ecc_test.ino

diff --git a/examples/ecc_test/ecc_test.ino b/examples/ecc_test/ecc_test.ino
index c3c8900..64a0be5 100644
--- a/examples/ecc_test/ecc_test.ino
+++ b/examples/ecc_test/ecc_test.ino
@@ -1,7 +1,5 @@
 #include <uECC.h>
 
-extern "C" {
-
 static int RNG(uint8_t *dest, unsigned size) {
   // Use the least-significant bits from the ADC for an unconnected pin (or connected to a source of 
   // random noise). This can take a long time to generate random data if the result of analogRead(0) 
@@ -29,8 +27,6 @@
   return 1;
 }
 
-}  // extern "C"
-
 void setup() {
   Serial.begin(115200);
   Serial.print("Testing ecc\n");
@@ -82,4 +78,3 @@
     Serial.print("Shared secrets are identical\n");
   }
 }
-