Fix issue related to teardown of some App Tests (#33654)
* Fix issue related to teardown of some App Tests
* Update comment
Co-authored-by: Boris Zbarsky <bzbarsky@apple.com>
---------
Co-authored-by: Boris Zbarsky <bzbarsky@apple.com>
diff --git a/src/app/tests/AppTestContext.cpp b/src/app/tests/AppTestContext.cpp
index eca7a2d..ff1154d 100644
--- a/src/app/tests/AppTestContext.cpp
+++ b/src/app/tests/AppTestContext.cpp
@@ -49,6 +49,18 @@
void AppContext::TearDownTestSuite()
{
+ // Some test suites finish with unprocessed work left in the platform manager event queue.
+ // This can particularly be a problem when this unprocessed work involves reporting engine runs,
+ // since those can take a while and cause later tests to not reach their queued work before
+ // their timeouts hit. This is only an issue in setups where all unit tests are compiled into
+ // a single file (e.g. nRF CI (Zephyr native_posix)).
+ //
+ // Work around this issue by doing a DrainAndServiceIO() here to attempt to flush out any queued-up work.
+ //
+ // TODO: Solve the underlying issue where test suites leave unprocessed work. Or is this actually
+ // the right solution?
+ LoopbackMessagingContext::DrainAndServiceIO();
+
chip::DeviceLayer::PlatformMgr().Shutdown();
LoopbackMessagingContext::TearDownTestSuite();
}
diff --git a/src/app/tests/BUILD.gn b/src/app/tests/BUILD.gn
index df6737a..2840877 100644
--- a/src/app/tests/BUILD.gn
+++ b/src/app/tests/BUILD.gn
@@ -123,6 +123,7 @@
output_name = "libAppTests"
test_sources = [
+ "TestAclAttribute.cpp",
"TestAclEvent.cpp",
"TestAttributeAccessInterfaceCache.cpp",
"TestAttributePathExpandIterator.cpp",
@@ -151,6 +152,7 @@
"TestPendingResponseTrackerImpl.cpp",
"TestPowerSourceCluster.cpp",
"TestReadInteraction.cpp",
+ "TestReportScheduler.cpp",
"TestReportingEngine.cpp",
"TestStatusIB.cpp",
"TestStatusResponseMessage.cpp",
@@ -164,8 +166,6 @@
test_sources += [ "TestFailSafeContext.cpp" ]
}
- test_sources += [ "TestAclAttribute.cpp" ]
-
# DefaultICDClientStorage assumes that raw AES key is used by the application
if (chip_crypto != "psa") {
test_sources += [ "TestDefaultICDClientStorage.cpp" ]
@@ -189,16 +189,6 @@
test_sources += [ "TestEventLogging.cpp" ]
}
- # The platform manager is not properly clearing queues in test teardown, which results in
- # DrainIO calls not being able to run in expected time (5seconds) if unprocessed reported engine
- # runs are remaining, causing tests to crash in Open IoT SDK and Zephyr tests since they are
- # running all tests in one file. We need to figure out how to properly clean the event queues
- # before enabling this test for these platforms.
- if (chip_device_platform != "nrfconnect" &&
- chip_device_platform != "openiotsdk") {
- test_sources += [ "TestReportScheduler.cpp" ]
- }
-
cflags = [ "-Wconversion" ]
public_deps = [
