CHIP Test Suites

• CHIP Test Suites
• Controllers
• Automatic conversion process
• Lists
  • List: chip_tests
    • Property: test
    • Property: config
      • Property: {variable_name}
  • List: chip_tests_items
    • Property: tests
      • Property: arguments
      • Property: values
      • Property: response
      • Property: constraints
  • List: chip_tests_item_parameters
  • List: chip_tests_item_response_parameters
  • List: chip_tests_pics
  • List: chip_tests_config
• YAML Test Definition
  • Location of Test Definitions
• PICS Usage - Required Files - Example PICS Command
• Examples
  • YAML Examples
  • ZAP Example
    • Required Files
    • Generate Example Script
• Index

This directory contains a set of tests describing interactions between nodes, and more specifically between a controller and a controllee.

This test set is written in a high level language before being automatically converted into a language understandable by the different controllers.

Controllers

There are currently 4 implementations of the CHIP device controller. These different implementations share a common configuration file describing the supported functionalities in terms of clusters, commands and attributes: controllers-clusters.zap

For more information on the different implementations of the CHIP device controller, see README.md

Automatic conversion process

The process of automatic conversion of test files depends on the ZAP tool.

Each of the CHIP device controller implementations uses a dedicated template translating the tests into an appropriate format.

These dedicated templates share a common script which augments the test file with the content of the ZAP database built from the definition files of the specification.

Lists

This common script exposes the result of the analysis in the form of multiple lists accessible from the dedicated template files.

These lists contain elements of which certain properties are directly configurable through the source test file, but also additional properties added during the analysis.

List: chip_tests

{{chip_tests}} takes as parameter a list of test files and returns an iterable list of objects.

Each element of the list is an object with the following properties:

Property: test

Property: config

Property: {variable_name}

Additionally, the object exhibits the following autogenerated properties:

List: chip_tests_items

{{chip_tests_items}} can be used inside a {{chip_tests}} block and iterates over the test set.

Each element of the list is an object with the following configurable properties:

Property: tests

Property: arguments

Property: values

Property: response

Property: constraints

Note: The hasValue constraint is only applied to optional fields. The other constraints are ignored for optional fields that do not have a value.

Additionally, the object exhibits the following autogenerated properties:

List: chip_tests_item_parameters

{{chip_tests_item_parameters}} can be used inside a {{chip_test_items}} block and iterates over the test arguments for the target command.

This object contains all the properties contained in the ZAP database related to the command or the attribute in the case of a special attribute command.

It is increased by the value to be used contained in the test file.

List: chip_tests_item_response_parameters

{{chip_tests_item_response_parameters}} can be used inside a {{chip_test_items}} block and iterates over the test response arguments for the target command.

This object contains all the properties contained in the ZAP database related to the response or the attribute response in the case of a special attribute command.

It is increased by the expected value or the constraints to be used contained in the test file.

List: chip_tests_pics

{{chip_tests_pics}} can be used to get the collection of all PICS for a given test.

List: chip_tests_config

{{chip_tests_config}} can be used to get the collection of user defined variables in the config. See ZAP Tests Config below

This object contains {{name}} {{definedValue}} and {{type}}. (chip_tests_config_has definedValue) can be used to determine if there is a value set for a particular user defined variable.

YAML Test Definition

YAML is used to generate tests into a programming language understood by commissioners, controllers, or simulated devices. There is a define set of keyword/values that are used to define test behavior.

YAML is the high level language chosen to generate test against a controller or a controllee. Test Definition Example

Top level key to define a YAML test: test

Location of Test Definitions

• Simulated README

• Simulated tests: tests.js

• chip-tool(darwin) tests: tests.js

• chip-tool tests: tests.js

  // Manual test definitions. Does not run in CI.
  function  getManualTests();
  
  // Test definition that run in CI.
  function getTests();
  

PICS Usage

Required Files

• PICS Test YAML
• TestPICS

Example PICS Command

chip-tool tests Test 1 --PICS TestPICS.txt

Examples

YAML Examples

• Basic YAML Config Example
• YAML Response Example
• YAML Tests Example
• YAML Config Variables Example

ZAP Example

Required Files

• ZAP Example
• Test1
• Test2
• Test3

Generate Example Script

The following script will generate an output file TestGenExample.out in src/app/tests/suites/examples/out. The directory and the file will be created. This is a basic demonstration on how tests are generated.

src/app/tests/suites/examples/gen_readme_example.sh

Index