Speed up the generation of storage format test cases
Restore the optimization done in
HEAD^{/Speed up the generation of storage format test cases}
which was lost during refactoring made when adding support for
implicit usage flags.
There are still more than one call to the C compiler, but the extra
calls are only for some key usage test cases.
This is an internal refactoring. This commit does not change the
output of generate_psa_tests.py
Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
diff --git a/tests/scripts/generate_psa_tests.py b/tests/scripts/generate_psa_tests.py
index b59ed74..c788ce6 100755
--- a/tests/scripts/generate_psa_tests.py
+++ b/tests/scripts/generate_psa_tests.py
@@ -495,7 +495,8 @@
# test cases. This allows all required information to be obtained in
# one go, which is a significant performance gain as the information
# includes numerical values obtained by compiling a C program.
- for key in self.generate_all_keys():
+ all_keys = list(self.generate_all_keys())
+ for key in all_keys:
if key.location_value() != 0:
# Skip keys with a non-default location, because they
# require a driver and we currently have no mechanism to
