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/*
*
* Copyright (c) 2020 Project CHIP Authors
* All rights reserved.
*
* Licensed under the Apache License, Version 2.0 (the "License");
* you may not use this file except in compliance with the License.
* You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*/
/**
* @file
* This file implements a unit test suite for CHIP SafeInt functions
*
*/
#include <lib/support/Span.h>
#include <lib/support/UnitTestRegistration.h>
#include <nlunit-test.h>
using namespace chip;
static void TestByteSpan(nlTestSuite * inSuite, void * inContext)
{
uint8_t arr[] = { 1, 2, 3 };
ByteSpan s0 = ByteSpan();
NL_TEST_ASSERT(inSuite, s0.data() == nullptr);
NL_TEST_ASSERT(inSuite, s0.size() == 0);
NL_TEST_ASSERT(inSuite, s0.empty());
NL_TEST_ASSERT(inSuite, s0.data_equal(s0));
NL_TEST_ASSERT(inSuite, IsSpanUsable(s0) == false);
ByteSpan s1(arr, 2);
NL_TEST_ASSERT(inSuite, s1.data() == arr);
NL_TEST_ASSERT(inSuite, s1.size() == 2);
NL_TEST_ASSERT(inSuite, !s1.empty());
NL_TEST_ASSERT(inSuite, s1.data_equal(s1));
NL_TEST_ASSERT(inSuite, !s1.data_equal(s0));
NL_TEST_ASSERT(inSuite, IsSpanUsable(s1) == true);
ByteSpan s2(arr);
NL_TEST_ASSERT(inSuite, s2.data() == arr);
NL_TEST_ASSERT(inSuite, s2.size() == 3);
NL_TEST_ASSERT(inSuite, s2.data()[2] == 3);
NL_TEST_ASSERT(inSuite, !s2.empty());
NL_TEST_ASSERT(inSuite, s2.data_equal(s2));
NL_TEST_ASSERT(inSuite, !s2.data_equal(s1));
NL_TEST_ASSERT(inSuite, IsSpanUsable(s2) == true);
ByteSpan s3 = s2;
NL_TEST_ASSERT(inSuite, s3.data() == arr);
NL_TEST_ASSERT(inSuite, s3.size() == 3);
NL_TEST_ASSERT(inSuite, s3.data()[2] == 3);
NL_TEST_ASSERT(inSuite, !s3.empty());
NL_TEST_ASSERT(inSuite, s3.data_equal(s2));
NL_TEST_ASSERT(inSuite, IsSpanUsable(s3) == true);
uint8_t arr2[] = { 3, 2, 1 };
ByteSpan s4(arr2);
NL_TEST_ASSERT(inSuite, !s4.data_equal(s2));
ByteSpan s5(arr2, 0);
NL_TEST_ASSERT(inSuite, s5.data() != nullptr);
NL_TEST_ASSERT(inSuite, !s5.data_equal(s4));
NL_TEST_ASSERT(inSuite, s5.data_equal(s0));
NL_TEST_ASSERT(inSuite, s0.data_equal(s5));
ByteSpan s6(arr2);
s6.reduce_size(2);
NL_TEST_ASSERT(inSuite, s6.size() == 2);
ByteSpan s7(arr2, 2);
NL_TEST_ASSERT(inSuite, s6.data_equal(s7));
NL_TEST_ASSERT(inSuite, s7.data_equal(s6));
}
static void TestMutableByteSpan(nlTestSuite * inSuite, void * inContext)
{
uint8_t arr[] = { 1, 2, 3 };
MutableByteSpan s0 = MutableByteSpan();
NL_TEST_ASSERT(inSuite, s0.data() == nullptr);
NL_TEST_ASSERT(inSuite, s0.size() == 0);
NL_TEST_ASSERT(inSuite, s0.empty());
NL_TEST_ASSERT(inSuite, s0.data_equal(s0));
NL_TEST_ASSERT(inSuite, IsSpanUsable(s0) == false);
MutableByteSpan s1(arr, 2);
NL_TEST_ASSERT(inSuite, s1.data() == arr);
NL_TEST_ASSERT(inSuite, s1.size() == 2);
NL_TEST_ASSERT(inSuite, !s1.empty());
NL_TEST_ASSERT(inSuite, s1.data_equal(s1));
NL_TEST_ASSERT(inSuite, !s1.data_equal(s0));
NL_TEST_ASSERT(inSuite, IsSpanUsable(s1) == true);
MutableByteSpan s2(arr);
NL_TEST_ASSERT(inSuite, s2.data() == arr);
NL_TEST_ASSERT(inSuite, s2.size() == 3);
NL_TEST_ASSERT(inSuite, s2.data()[2] == 3);
NL_TEST_ASSERT(inSuite, !s2.empty());
NL_TEST_ASSERT(inSuite, s2.data_equal(s2));
NL_TEST_ASSERT(inSuite, !s2.data_equal(s1));
MutableByteSpan s3 = s2;
NL_TEST_ASSERT(inSuite, s3.data() == arr);
NL_TEST_ASSERT(inSuite, s3.size() == 3);
NL_TEST_ASSERT(inSuite, s3.data()[2] == 3);
NL_TEST_ASSERT(inSuite, !s3.empty());
NL_TEST_ASSERT(inSuite, s3.data_equal(s2));
uint8_t arr2[] = { 3, 2, 1 };
MutableByteSpan s4(arr2);
NL_TEST_ASSERT(inSuite, !s4.data_equal(s2));
MutableByteSpan s5(arr2, 0);
NL_TEST_ASSERT(inSuite, s5.data() != nullptr);
NL_TEST_ASSERT(inSuite, !s5.data_equal(s4));
NL_TEST_ASSERT(inSuite, s5.data_equal(s0));
NL_TEST_ASSERT(inSuite, s0.data_equal(s5));
MutableByteSpan s6(arr2);
s6.reduce_size(2);
NL_TEST_ASSERT(inSuite, s6.size() == 2);
MutableByteSpan s7(arr2, 2);
NL_TEST_ASSERT(inSuite, s6.data_equal(s7));
NL_TEST_ASSERT(inSuite, s7.data_equal(s6));
uint8_t arr3[] = { 1, 2, 3 };
MutableByteSpan s8(arr3);
NL_TEST_ASSERT(inSuite, arr3[1] == 2);
s8.data()[1] = 3;
NL_TEST_ASSERT(inSuite, arr3[1] == 3);
// Not mutable span on purpose, to test conversion.
ByteSpan s9 = s8;
NL_TEST_ASSERT(inSuite, s9.data_equal(s8));
NL_TEST_ASSERT(inSuite, s8.data_equal(s9));
// Not mutable span on purpose.
ByteSpan s10(s8);
NL_TEST_ASSERT(inSuite, s10.data_equal(s8));
NL_TEST_ASSERT(inSuite, s8.data_equal(s10));
}
static void TestFixedByteSpan(nlTestSuite * inSuite, void * inContext)
{
uint8_t arr[] = { 1, 2, 3 };
FixedByteSpan<3> s0 = FixedByteSpan<3>();
NL_TEST_ASSERT(inSuite, s0.data() == nullptr);
NL_TEST_ASSERT(inSuite, s0.size() == 3);
NL_TEST_ASSERT(inSuite, s0.empty());
NL_TEST_ASSERT(inSuite, s0.data_equal(s0));
NL_TEST_ASSERT(inSuite, IsSpanUsable(s0) == false);
FixedByteSpan<2> s1(arr);
NL_TEST_ASSERT(inSuite, s1.data() == arr);
NL_TEST_ASSERT(inSuite, s1.size() == 2);
NL_TEST_ASSERT(inSuite, !s1.empty());
NL_TEST_ASSERT(inSuite, s1.data_equal(s1));
NL_TEST_ASSERT(inSuite, IsSpanUsable(s1) == true);
FixedByteSpan<3> s2(arr);
NL_TEST_ASSERT(inSuite, s2.data() == arr);
NL_TEST_ASSERT(inSuite, s2.size() == 3);
NL_TEST_ASSERT(inSuite, s2.data()[2] == 3);
NL_TEST_ASSERT(inSuite, !s2.empty());
NL_TEST_ASSERT(inSuite, s2.data_equal(s2));
FixedByteSpan<3> s3 = s2;
NL_TEST_ASSERT(inSuite, s3.data() == arr);
NL_TEST_ASSERT(inSuite, s3.size() == 3);
NL_TEST_ASSERT(inSuite, s3.data()[2] == 3);
NL_TEST_ASSERT(inSuite, !s3.empty());
NL_TEST_ASSERT(inSuite, s3.data_equal(s2));
uint8_t arr2[] = { 3, 2, 1 };
FixedSpan<uint8_t, 3> s4(arr2);
NL_TEST_ASSERT(inSuite, !s4.data_equal(s2));
size_t idx = 0;
for (auto & entry : s4)
{
NL_TEST_ASSERT(inSuite, entry == arr2[idx++]);
}
NL_TEST_ASSERT(inSuite, idx == 3);
FixedByteSpan<3> s5(arr2);
NL_TEST_ASSERT(inSuite, s5.data_equal(s4));
NL_TEST_ASSERT(inSuite, s4.data_equal(s5));
FixedByteSpan<2> s6(s4);
idx = 0;
for (auto & entry : s6)
{
NL_TEST_ASSERT(inSuite, entry == arr2[idx++]);
}
NL_TEST_ASSERT(inSuite, idx == 2);
// Not fixed, to test conversion.
ByteSpan s7(s4);
NL_TEST_ASSERT(inSuite, s7.data_equal(s4));
NL_TEST_ASSERT(inSuite, s4.data_equal(s7));
MutableByteSpan s8(s4);
NL_TEST_ASSERT(inSuite, s8.data_equal(s4));
NL_TEST_ASSERT(inSuite, s4.data_equal(s8));
}
static void TestSpanOfPointers(nlTestSuite * inSuite, void * inContext)
{
uint8_t x = 5;
uint8_t * ptrs[] = { &x, &x };
Span<uint8_t *> s1(ptrs);
Span<uint8_t * const> s2(s1);
NL_TEST_ASSERT(inSuite, s1.data_equal(s2));
NL_TEST_ASSERT(inSuite, s2.data_equal(s1));
FixedSpan<uint8_t *, 2> s3(ptrs);
FixedSpan<uint8_t * const, 2> s4(s3);
NL_TEST_ASSERT(inSuite, s1.data_equal(s3));
NL_TEST_ASSERT(inSuite, s3.data_equal(s1));
NL_TEST_ASSERT(inSuite, s2.data_equal(s3));
NL_TEST_ASSERT(inSuite, s3.data_equal(s2));
NL_TEST_ASSERT(inSuite, s1.data_equal(s4));
NL_TEST_ASSERT(inSuite, s4.data_equal(s1));
NL_TEST_ASSERT(inSuite, s2.data_equal(s4));
NL_TEST_ASSERT(inSuite, s4.data_equal(s2));
NL_TEST_ASSERT(inSuite, s3.data_equal(s4));
NL_TEST_ASSERT(inSuite, s4.data_equal(s3));
Span<uint8_t *> s5(s3);
NL_TEST_ASSERT(inSuite, s5.data_equal(s3));
NL_TEST_ASSERT(inSuite, s3.data_equal(s5));
}
static void TestSubSpan(nlTestSuite * inSuite, void * inContext)
{
uint8_t array[16];
ByteSpan span(array);
NL_TEST_ASSERT(inSuite, span.data() == &array[0]);
NL_TEST_ASSERT(inSuite, span.size() == 16);
ByteSpan subspan = span.SubSpan(1, 14);
NL_TEST_ASSERT(inSuite, subspan.data() == &array[1]);
NL_TEST_ASSERT(inSuite, subspan.size() == 14);
subspan = span.SubSpan(1, 0);
NL_TEST_ASSERT(inSuite, subspan.size() == 0);
subspan = span.SubSpan(10);
NL_TEST_ASSERT(inSuite, subspan.data() == &array[10]);
NL_TEST_ASSERT(inSuite, subspan.size() == 6);
subspan = span.SubSpan(16);
NL_TEST_ASSERT(inSuite, subspan.size() == 0);
}
static void TestFromZclString(nlTestSuite * inSuite, void * inContext)
{
// Purposefully larger size than data.
constexpr uint8_t array[16] = { 3, 0x41, 0x63, 0x45 };
constexpr char str[] = "AcE";
ByteSpan s1 = ByteSpan::fromZclString(array);
NL_TEST_ASSERT(inSuite, s1.data_equal(ByteSpan(&array[1], 3)));
CharSpan s2 = CharSpan::fromZclString(array);
NL_TEST_ASSERT(inSuite, s2.data_equal(CharSpan(str, 3)));
}
static void TestFromCharString(nlTestSuite * inSuite, void * inContext)
{
constexpr char str[] = "AcE";
CharSpan s1 = CharSpan::fromCharString(str);
NL_TEST_ASSERT(inSuite, s1.data_equal(CharSpan(str, 3)));
}
#define NL_TEST_DEF_FN(fn) NL_TEST_DEF("Test " #fn, fn)
/**
* Test Suite. It lists all the test functions.
*/
static const nlTest sTests[] = { NL_TEST_DEF_FN(TestByteSpan), NL_TEST_DEF_FN(TestMutableByteSpan),
NL_TEST_DEF_FN(TestFixedByteSpan), NL_TEST_DEF_FN(TestSpanOfPointers),
NL_TEST_DEF_FN(TestSubSpan), NL_TEST_DEF_FN(TestFromZclString),
NL_TEST_DEF_FN(TestFromCharString), NL_TEST_SENTINEL() };
int TestSpan(void)
{
nlTestSuite theSuite = { "CHIP Span tests", &sTests[0], nullptr, nullptr };
// Run test suit againt one context.
nlTestRunner(&theSuite, nullptr);
return nlTestRunnerStats(&theSuite);
}
CHIP_REGISTER_TEST_SUITE(TestSpan)