| /* |
| * |
| * Copyright (c) 2022-2023 Project CHIP Authors |
| * All rights reserved. |
| * |
| * Licensed under the Apache License, Version 2.0 (the "License"); |
| * you may not use this file except in compliance with the License. |
| * You may obtain a copy of the License at |
| * |
| * http://www.apache.org/licenses/LICENSE-2.0 |
| * |
| * Unless required by applicable law or agreed to in writing, software |
| * distributed under the License is distributed on an "AS IS" BASIS, |
| * WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied. |
| * See the License for the specific language governing permissions and |
| * limitations under the License. |
| */ |
| |
| #include "app-common/zap-generated/ids/Attributes.h" |
| #include "app-common/zap-generated/ids/Clusters.h" |
| #include "app/ConcreteAttributePath.h" |
| #include "protocols/interaction_model/Constants.h" |
| #include <app-common/zap-generated/cluster-objects.h> |
| #include <app/AppConfig.h> |
| #include <app/AttributeAccessInterface.h> |
| #include <app/AttributeAccessInterfaceRegistry.h> |
| #include <app/BufferedReadCallback.h> |
| #include <app/CommandHandlerInterface.h> |
| #include <app/EventLogging.h> |
| #include <app/GlobalAttributes.h> |
| #include <app/InteractionModelEngine.h> |
| #include <app/data-model/Decode.h> |
| #include <app/tests/AppTestContext.h> |
| #include <app/util/DataModelHandler.h> |
| #include <app/util/attribute-storage.h> |
| #include <controller/InvokeInteraction.h> |
| #include <lib/core/CHIPCore.h> |
| #include <lib/core/ErrorStr.h> |
| #include <lib/support/CHIPCounter.h> |
| #include <lib/support/TimeUtils.h> |
| #include <lib/support/UnitTestContext.h> |
| #include <lib/support/UnitTestRegistration.h> |
| #include <lib/support/UnitTestUtils.h> |
| #include <lib/support/logging/CHIPLogging.h> |
| #include <messaging/tests/MessagingContext.h> |
| #include <nlunit-test.h> |
| |
| using namespace chip; |
| using namespace chip::app; |
| using namespace chip::app::Clusters; |
| |
| namespace { |
| |
| static uint8_t gDebugEventBuffer[4096]; |
| static uint8_t gInfoEventBuffer[4096]; |
| static uint8_t gCritEventBuffer[4096]; |
| static chip::app::CircularEventBuffer gCircularEventBuffer[3]; |
| |
| class TestContext : public chip::Test::AppContext |
| { |
| public: |
| // Performs setup for each individual test in the test suite |
| void SetUp() override |
| { |
| const chip::app::LogStorageResources logStorageResources[] = { |
| { &gDebugEventBuffer[0], sizeof(gDebugEventBuffer), chip::app::PriorityLevel::Debug }, |
| { &gInfoEventBuffer[0], sizeof(gInfoEventBuffer), chip::app::PriorityLevel::Info }, |
| { &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical }, |
| }; |
| |
| chip::Test::AppContext::SetUp(); |
| |
| CHIP_ERROR err = CHIP_NO_ERROR; |
| // TODO: use ASSERT_EQ, once transition to pw_unit_test is complete |
| VerifyOrDieWithMsg((err = mEventCounter.Init(0)) == CHIP_NO_ERROR, AppServer, |
| "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format()); |
| chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources), |
| gCircularEventBuffer, logStorageResources, &mEventCounter); |
| } |
| |
| // Performs teardown for each individual test in the test suite |
| void TearDown() override |
| { |
| chip::app::EventManagement::DestroyEventManagement(); |
| chip::Test::AppContext::TearDown(); |
| } |
| |
| private: |
| MonotonicallyIncreasingCounter<EventNumber> mEventCounter; |
| }; |
| |
| uint32_t gIterationCount = 0; |
| nlTestSuite * gSuite = nullptr; |
| |
| // |
| // The generated endpoint_config for the controller app has Endpoint 1 |
| // already used in the fixed endpoint set of size 1. Consequently, let's use the next |
| // number higher than that for our dynamic test endpoint. |
| // |
| constexpr EndpointId kTestEndpointId = 2; |
| constexpr AttributeId kTestListLargeAttribute = 8; // This attribute will be larger than the event size we used in this test. |
| |
| // The size of the attribute which is a bit larger than the size of event used in the test. |
| constexpr size_t kSizeOfLargeAttribute = 60; |
| |
| class TestReadEvents |
| { |
| public: |
| TestReadEvents() {} |
| static void TestEventChunking(nlTestSuite * apSuite, void * apContext); |
| static void TestMixedEventsAndAttributesChunking(nlTestSuite * apSuite, void * apContext); |
| static void TestMixedEventsAndLargeAttributesChunking(nlTestSuite * apSuite, void * apContext); |
| |
| private: |
| }; |
| |
| //clang-format off |
| DECLARE_DYNAMIC_ATTRIBUTE_LIST_BEGIN(testClusterAttrs) |
| DECLARE_DYNAMIC_ATTRIBUTE(0x00000001, INT8U, 1, 0), DECLARE_DYNAMIC_ATTRIBUTE(0x00000002, INT8U, 1, 0), |
| DECLARE_DYNAMIC_ATTRIBUTE(0x00000003, INT8U, 1, 0), DECLARE_DYNAMIC_ATTRIBUTE(0x00000004, INT8U, 1, 0), |
| DECLARE_DYNAMIC_ATTRIBUTE(0x00000005, INT8U, 1, 0), DECLARE_DYNAMIC_ATTRIBUTE_LIST_END(); |
| |
| DECLARE_DYNAMIC_CLUSTER_LIST_BEGIN(testEndpointClusters) |
| DECLARE_DYNAMIC_CLUSTER(Clusters::UnitTesting::Id, testClusterAttrs, ZAP_CLUSTER_MASK(SERVER), nullptr, nullptr), |
| DECLARE_DYNAMIC_CLUSTER_LIST_END; |
| |
| DECLARE_DYNAMIC_ENDPOINT(testEndpoint, testEndpointClusters); |
| |
| DECLARE_DYNAMIC_ATTRIBUTE_LIST_BEGIN(testClusterAttrsOnEndpoint4) |
| DECLARE_DYNAMIC_ATTRIBUTE(kTestListLargeAttribute, ARRAY, 1, 0), DECLARE_DYNAMIC_ATTRIBUTE_LIST_END(); |
| |
| DECLARE_DYNAMIC_CLUSTER_LIST_BEGIN(testEndpoint4Clusters) |
| DECLARE_DYNAMIC_CLUSTER(Clusters::UnitTesting::Id, testClusterAttrsOnEndpoint4, ZAP_CLUSTER_MASK(SERVER), nullptr, nullptr), |
| DECLARE_DYNAMIC_CLUSTER_LIST_END; |
| |
| DECLARE_DYNAMIC_ENDPOINT(testEndpoint4, testEndpoint4Clusters); |
| |
| //clang-format on |
| |
| uint8_t sAnStringThatCanNeverFitIntoTheMTU[4096] = { 0 }; |
| |
| class TestReadCallback : public app::ReadClient::Callback |
| { |
| public: |
| TestReadCallback() : mBufferedCallback(*this) {} |
| void OnAttributeData(const app::ConcreteDataAttributePath & aPath, TLV::TLVReader * apData, |
| const app::StatusIB & aStatus) override; |
| |
| void OnEventData(const app::EventHeader & aEventHeader, TLV::TLVReader * apData, const app::StatusIB * apStatus) override; |
| |
| void OnDone(app::ReadClient * apReadClient) override; |
| |
| void OnReportEnd() override { mOnReportEnd = true; } |
| |
| void OnSubscriptionEstablished(SubscriptionId aSubscriptionId) override { mOnSubscriptionEstablished = true; } |
| |
| uint32_t mAttributeCount = 0; |
| uint32_t mEventCount = 0; |
| bool mOnReportEnd = false; |
| bool mOnSubscriptionEstablished = false; |
| app::BufferedReadCallback mBufferedCallback; |
| }; |
| |
| void TestReadCallback::OnAttributeData(const app::ConcreteDataAttributePath & aPath, TLV::TLVReader * apData, |
| const app::StatusIB & aStatus) |
| { |
| if (aPath.mAttributeId == Globals::Attributes::GeneratedCommandList::Id) |
| { |
| app::DataModel::DecodableList<CommandId> v; |
| NL_TEST_ASSERT(gSuite, app::DataModel::Decode(*apData, v) == CHIP_NO_ERROR); |
| auto it = v.begin(); |
| size_t arraySize = 0; |
| while (it.Next()) |
| { |
| NL_TEST_ASSERT(gSuite, false); |
| } |
| NL_TEST_ASSERT(gSuite, it.GetStatus() == CHIP_NO_ERROR); |
| NL_TEST_ASSERT(gSuite, v.ComputeSize(&arraySize) == CHIP_NO_ERROR); |
| NL_TEST_ASSERT(gSuite, arraySize == 0); |
| } |
| else if (aPath.mAttributeId == Globals::Attributes::AcceptedCommandList::Id) |
| { |
| app::DataModel::DecodableList<CommandId> v; |
| NL_TEST_ASSERT(gSuite, app::DataModel::Decode(*apData, v) == CHIP_NO_ERROR); |
| auto it = v.begin(); |
| size_t arraySize = 0; |
| while (it.Next()) |
| { |
| NL_TEST_ASSERT(gSuite, false); |
| } |
| NL_TEST_ASSERT(gSuite, it.GetStatus() == CHIP_NO_ERROR); |
| NL_TEST_ASSERT(gSuite, v.ComputeSize(&arraySize) == CHIP_NO_ERROR); |
| NL_TEST_ASSERT(gSuite, arraySize == 0); |
| } |
| #if CHIP_CONFIG_ENABLE_EVENTLIST_ATTRIBUTE |
| else if (aPath.mAttributeId == Globals::Attributes::EventList::Id) |
| { |
| // Nothing to check for this one; depends on the endpoint. |
| } |
| #endif // CHIP_CONFIG_ENABLE_EVENTLIST_ATTRIBUTE |
| else if (aPath.mAttributeId == Globals::Attributes::AttributeList::Id) |
| { |
| // Nothing to check for this one; depends on the endpoint. |
| } |
| else if (aPath.mAttributeId == kTestListLargeAttribute) |
| { |
| app::DataModel::DecodableList<ByteSpan> v; |
| NL_TEST_ASSERT(gSuite, app::DataModel::Decode(*apData, v) == CHIP_NO_ERROR); |
| auto it = v.begin(); |
| size_t arraySize = 0; |
| NL_TEST_ASSERT(gSuite, v.ComputeSize(&arraySize) == CHIP_NO_ERROR); |
| NL_TEST_ASSERT(gSuite, arraySize == 4); |
| } |
| else |
| { |
| uint8_t v; |
| NL_TEST_ASSERT(gSuite, app::DataModel::Decode(*apData, v) == CHIP_NO_ERROR); |
| NL_TEST_ASSERT(gSuite, v == (uint8_t) gIterationCount); |
| } |
| mAttributeCount++; |
| } |
| |
| void TestReadCallback::OnEventData(const app::EventHeader & aEventHeader, TLV::TLVReader * apData, const app::StatusIB * aStatus) |
| { |
| VerifyOrReturn(apData != nullptr); |
| mEventCount++; |
| } |
| |
| void TestReadCallback::OnDone(app::ReadClient *) {} |
| |
| class TestAttrAccess : public app::AttributeAccessInterface |
| { |
| public: |
| // Register for the Test Cluster cluster on all endpoints. |
| TestAttrAccess() : AttributeAccessInterface(Optional<EndpointId>::Missing(), Clusters::UnitTesting::Id) |
| { |
| registerAttributeAccessOverride(this); |
| } |
| |
| CHIP_ERROR Read(const app::ConcreteReadAttributePath & aPath, app::AttributeValueEncoder & aEncoder) override; |
| CHIP_ERROR Write(const app::ConcreteDataAttributePath & aPath, app::AttributeValueDecoder & aDecoder) override; |
| }; |
| |
| TestAttrAccess gAttrAccess; |
| |
| CHIP_ERROR TestAttrAccess::Read(const app::ConcreteReadAttributePath & aPath, app::AttributeValueEncoder & aEncoder) |
| { |
| switch (aPath.mAttributeId) |
| { |
| case kTestListLargeAttribute: |
| return aEncoder.EncodeList([](const auto & encoder) { |
| for (int i = 0; i < 4; i++) |
| { |
| // When putting even numbers of list entries, there is a point (a range of iterations) that we can put an event |
| // between two list items in the same chunk. |
| ReturnErrorOnFailure(encoder.Encode(ByteSpan(sAnStringThatCanNeverFitIntoTheMTU, kSizeOfLargeAttribute))); |
| } |
| return CHIP_NO_ERROR; |
| }); |
| default: |
| return aEncoder.Encode((uint8_t) gIterationCount); |
| } |
| } |
| |
| CHIP_ERROR TestAttrAccess::Write(const app::ConcreteDataAttributePath & aPath, app::AttributeValueDecoder & aDecoder) |
| { |
| return CHIP_ERROR_UNSUPPORTED_CHIP_FEATURE; |
| } |
| |
| namespace { |
| |
| void GenerateEvents(nlTestSuite * apSuite, chip::EventNumber & firstEventNumber, chip::EventNumber & lastEventNumber) |
| { |
| CHIP_ERROR err = CHIP_NO_ERROR; |
| |
| Clusters::UnitTesting::Events::TestEvent::Type content; |
| content.arg1 = static_cast<uint8_t>(gIterationCount); |
| |
| for (int i = 0; i < 5; i++) |
| { |
| NL_TEST_ASSERT(apSuite, (err = app::LogEvent(content, kTestEndpointId, lastEventNumber)) == CHIP_NO_ERROR); |
| if (i == 0) |
| { |
| firstEventNumber = lastEventNumber; |
| } |
| } |
| } |
| |
| } // namespace |
| |
| /* |
| * This validates all the various corner cases encountered during chunking by |
| * artificially reducing the size of a packet buffer used to encode attribute & event data |
| * to force chunking to happen over multiple packets even with a small number of attributes or events |
| * and then slowly increasing the available size by 1 byte in each test iteration and re-running |
| * the report generation logic. This 1-byte incremental approach sweeps through from a base scenario of |
| * N attributes fitting in a report, to eventually resulting in N+1 attributes or events fitting in a report. |
| |
| * This will cause all the various corner cases encountered of closing out the various containers within |
| * the report and thoroughly and definitely validate those edge cases. |
| * |
| * Importantly, this test tries to re-use *as much as possible* the actual IM constructs used by real |
| * server-side applications. Consequently, this is why it registers a dynamic endpoint + fake attribute access + fake event |
| * generation interface to simulate faithfully a real application. This ensures validation of as much production logic pathways |
| * as we can possibly cover. |
| * |
| */ |
| void TestReadEvents::TestEventChunking(nlTestSuite * apSuite, void * apContext) |
| { |
| TestContext & ctx = *static_cast<TestContext *>(apContext); |
| auto sessionHandle = ctx.GetSessionBobToAlice(); |
| app::InteractionModelEngine * engine = app::InteractionModelEngine::GetInstance(); |
| |
| // Initialize the ember side server logic |
| InitDataModelHandler(); |
| |
| // Register our fake dynamic endpoint. |
| DataVersion dataVersionStorage[ArraySize(testEndpointClusters)]; |
| emberAfSetDynamicEndpoint(0, kTestEndpointId, &testEndpoint, Span<DataVersion>(dataVersionStorage)); |
| |
| chip::EventNumber firstEventNumber; |
| chip::EventNumber lastEventNumber; |
| |
| GenerateEvents(apSuite, firstEventNumber, lastEventNumber); |
| |
| app::EventPathParams eventPath; |
| eventPath.mEndpointId = kTestEndpointId; |
| eventPath.mClusterId = app::Clusters::UnitTesting::Id; |
| app::ReadPrepareParams readParams(sessionHandle); |
| |
| readParams.mpEventPathParamsList = &eventPath; |
| readParams.mEventPathParamsListSize = 1; |
| readParams.mEventNumber.SetValue(firstEventNumber); |
| |
| // Since we will always read from the first event, we only generate event once. |
| |
| // |
| // We've empirically determined that by reserving 950 bytes in the packet buffer, we can fit 2 |
| // AttributeDataIBs into the packet. ~30-40 bytes covers a single EventDataIB, but let's 2-3x that |
| // to ensure we'll sweep from fitting 2 IBs to 3-4 IBs. |
| // |
| for (int i = 100; i > 0; i--) |
| { |
| TestReadCallback readCallback; |
| |
| ChipLogDetail(DataManagement, "Running iteration %d\n", i); |
| |
| gIterationCount = (uint32_t) i; |
| |
| app::InteractionModelEngine::GetInstance()->GetReportingEngine().SetWriterReserved(static_cast<uint32_t>(800 + i)); |
| |
| app::ReadClient readClient(engine, &ctx.GetExchangeManager(), readCallback.mBufferedCallback, |
| app::ReadClient::InteractionType::Read); |
| |
| NL_TEST_ASSERT(apSuite, readClient.SendRequest(readParams) == CHIP_NO_ERROR); |
| |
| ctx.DrainAndServiceIO(); |
| |
| NL_TEST_ASSERT(apSuite, readCallback.mEventCount == static_cast<uint32_t>((lastEventNumber - firstEventNumber) + 1)); |
| NL_TEST_ASSERT(apSuite, ctx.GetExchangeManager().GetNumActiveExchanges() == 0); |
| |
| // |
| // Stop the test if we detected an error. Otherwise, it'll be difficult to read the logs. |
| // |
| if (apSuite->flagError) |
| { |
| break; |
| } |
| } |
| |
| emberAfClearDynamicEndpoint(0); |
| } |
| |
| // Similar to the tests above, but it will read attributes AND events |
| void TestReadEvents::TestMixedEventsAndAttributesChunking(nlTestSuite * apSuite, void * apContext) |
| { |
| TestContext & ctx = *static_cast<TestContext *>(apContext); |
| auto sessionHandle = ctx.GetSessionBobToAlice(); |
| app::InteractionModelEngine * engine = app::InteractionModelEngine::GetInstance(); |
| |
| // Initialize the ember side server logic |
| InitDataModelHandler(); |
| |
| // Register our fake dynamic endpoint. |
| DataVersion dataVersionStorage[ArraySize(testEndpointClusters)]; |
| emberAfSetDynamicEndpoint(0, kTestEndpointId, &testEndpoint, Span<DataVersion>(dataVersionStorage)); |
| |
| chip::EventNumber firstEventNumber; |
| chip::EventNumber lastEventNumber; |
| |
| // We will always read from the first event, so it is enough to only generate events once. |
| GenerateEvents(apSuite, firstEventNumber, lastEventNumber); |
| |
| app::EventPathParams eventPath; |
| app::AttributePathParams attributePath(kTestEndpointId, app::Clusters::UnitTesting::Id); |
| eventPath.mEndpointId = kTestEndpointId; |
| eventPath.mClusterId = app::Clusters::UnitTesting::Id; |
| app::ReadPrepareParams readParams(sessionHandle); |
| |
| readParams.mpAttributePathParamsList = &attributePath; |
| readParams.mAttributePathParamsListSize = 1; |
| readParams.mpEventPathParamsList = &eventPath; |
| readParams.mEventPathParamsListSize = 1; |
| readParams.mEventNumber.SetValue(firstEventNumber); |
| |
| // |
| // We've empirically determined that by reserving 950 bytes in the packet buffer, we can fit 2 |
| // AttributeDataIBs into the packet. ~30-40 bytes covers a single EventDataIB, but let's 2-3x that |
| // to ensure we'll sweep from fitting 2 IBs to 3-4 IBs. |
| // |
| for (int i = 100; i > 0; i--) |
| { |
| TestReadCallback readCallback; |
| |
| ChipLogDetail(DataManagement, "Running iteration %d\n", i); |
| |
| gIterationCount = (uint32_t) i; |
| |
| app::InteractionModelEngine::GetInstance()->GetReportingEngine().SetWriterReserved(static_cast<uint32_t>(800 + i)); |
| |
| app::ReadClient readClient(engine, &ctx.GetExchangeManager(), readCallback.mBufferedCallback, |
| app::ReadClient::InteractionType::Read); |
| |
| NL_TEST_ASSERT(apSuite, readClient.SendRequest(readParams) == CHIP_NO_ERROR); |
| |
| ctx.DrainAndServiceIO(); |
| |
| // |
| // Always returns the same number of attributes read (5 + revision + GlobalAttributesNotInMetadata). |
| // |
| NL_TEST_ASSERT(apSuite, readCallback.mOnReportEnd); |
| NL_TEST_ASSERT(apSuite, readCallback.mAttributeCount == 6 + ArraySize(GlobalAttributesNotInMetadata)); |
| NL_TEST_ASSERT(apSuite, readCallback.mEventCount == static_cast<uint32_t>(lastEventNumber - firstEventNumber + 1)); |
| |
| NL_TEST_ASSERT(apSuite, ctx.GetExchangeManager().GetNumActiveExchanges() == 0); |
| |
| // |
| // Stop the test if we detected an error. Otherwise, it'll be difficult to read the logs. |
| // |
| if (apSuite->flagError) |
| { |
| break; |
| } |
| } |
| |
| emberAfClearDynamicEndpoint(0); |
| } |
| |
| // Similar to the tests above, however, there is one another case -- the event payload is very large usually, so when it is failed |
| // to encode an attribute, it is usually impossible to encode a event data, so we cannot verify the case when events and attributes |
| // can be encoded in to one chunk in the tests above. This test will force it by reading only one attribtue and read many events. |
| void TestReadEvents::TestMixedEventsAndLargeAttributesChunking(nlTestSuite * apSuite, void * apContext) |
| { |
| TestContext & ctx = *static_cast<TestContext *>(apContext); |
| auto sessionHandle = ctx.GetSessionBobToAlice(); |
| app::InteractionModelEngine * engine = app::InteractionModelEngine::GetInstance(); |
| |
| // Initialize the ember side server logic |
| InitDataModelHandler(); |
| |
| // Register our fake dynamic endpoint. |
| DataVersion dataVersionStorage[ArraySize(testEndpointClusters)]; |
| emberAfSetDynamicEndpoint(0, kTestEndpointId, &testEndpoint4, Span<DataVersion>(dataVersionStorage)); |
| |
| chip::EventNumber firstEventNumber; |
| chip::EventNumber lastEventNumber; |
| |
| // We will always read from the first event, so it is enough to only generate events once. |
| GenerateEvents(apSuite, firstEventNumber, lastEventNumber); |
| |
| app::EventPathParams eventPath; |
| app::AttributePathParams attributePath(kTestEndpointId, app::Clusters::UnitTesting::Id, kTestListLargeAttribute); |
| eventPath.mEndpointId = kTestEndpointId; |
| eventPath.mClusterId = app::Clusters::UnitTesting::Id; |
| app::ReadPrepareParams readParams(sessionHandle); |
| |
| readParams.mpAttributePathParamsList = &attributePath; |
| readParams.mAttributePathParamsListSize = 1; |
| readParams.mpEventPathParamsList = &eventPath; |
| readParams.mEventPathParamsListSize = 1; |
| readParams.mEventNumber.SetValue(firstEventNumber); |
| |
| // |
| // We've empirically determined that by reserving 950 bytes in the packet buffer, we can fit 2 |
| // AttributeDataIBs into the packet. ~30-40 bytes covers a single EventDataIB, but let's 2-3x that |
| // to ensure we'll sweep from fitting 2 IBs to 3-4 IBs. |
| // |
| for (int i = 100; i > 0; i--) |
| { |
| TestReadCallback readCallback; |
| |
| ChipLogDetail(DataManagement, "Running iteration %d\n", i); |
| |
| gIterationCount = (uint32_t) i; |
| |
| app::InteractionModelEngine::GetInstance()->GetReportingEngine().SetWriterReserved(static_cast<uint32_t>(800 + i)); |
| |
| app::ReadClient readClient(engine, &ctx.GetExchangeManager(), readCallback.mBufferedCallback, |
| app::ReadClient::InteractionType::Read); |
| |
| NL_TEST_ASSERT(apSuite, readClient.SendRequest(readParams) == CHIP_NO_ERROR); |
| |
| ctx.DrainAndServiceIO(); |
| |
| NL_TEST_ASSERT(apSuite, readCallback.mOnReportEnd); |
| NL_TEST_ASSERT(apSuite, readCallback.mAttributeCount == 1); |
| NL_TEST_ASSERT(apSuite, readCallback.mEventCount == static_cast<uint32_t>(lastEventNumber - firstEventNumber + 1)); |
| |
| NL_TEST_ASSERT(apSuite, ctx.GetExchangeManager().GetNumActiveExchanges() == 0); |
| |
| // |
| // Stop the test if we detected an error. Otherwise, it'll be difficult to read the logs. |
| // |
| if (apSuite->flagError) |
| { |
| break; |
| } |
| } |
| |
| emberAfClearDynamicEndpoint(0); |
| } |
| |
| const nlTest sTests[] = { |
| NL_TEST_DEF("TestEventChunking", TestReadEvents::TestEventChunking), |
| NL_TEST_DEF("TestMixedEventsAndAttributesChunking", TestReadEvents::TestMixedEventsAndAttributesChunking), |
| NL_TEST_DEF("TestMixedEventsAndLargeAttributesChunking", TestReadEvents::TestMixedEventsAndLargeAttributesChunking), |
| NL_TEST_SENTINEL(), |
| }; |
| |
| nlTestSuite sSuite = { |
| "TestEventChunking", |
| &sTests[0], |
| TestContext::nlTestSetUpTestSuite, |
| TestContext::nlTestTearDownTestSuite, |
| TestContext::nlTestSetUp, |
| TestContext::nlTestTearDown, |
| }; |
| |
| } // namespace |
| |
| int TestEventChunkingTests() |
| { |
| gSuite = &sSuite; |
| return chip::ExecuteTestsWithContext<TestContext>(&sSuite); |
| } |
| |
| CHIP_REGISTER_TEST_SUITE(TestEventChunkingTests) |