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/*
*
* Copyright (c) 2022-2023 Project CHIP Authors
* All rights reserved.
*
* Licensed under the Apache License, Version 2.0 (the "License");
* you may not use this file except in compliance with the License.
* You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*/
#include "app-common/zap-generated/ids/Attributes.h"
#include "app-common/zap-generated/ids/Clusters.h"
#include "app/ConcreteAttributePath.h"
#include "protocols/interaction_model/Constants.h"
#include <app-common/zap-generated/cluster-objects.h>
#include <app/AppConfig.h>
#include <app/AttributeAccessInterface.h>
#include <app/AttributeAccessInterfaceRegistry.h>
#include <app/BufferedReadCallback.h>
#include <app/CommandHandlerInterface.h>
#include <app/EventLogging.h>
#include <app/GlobalAttributes.h>
#include <app/InteractionModelEngine.h>
#include <app/data-model/Decode.h>
#include <app/tests/AppTestContext.h>
#include <app/util/DataModelHandler.h>
#include <app/util/attribute-storage.h>
#include <controller/InvokeInteraction.h>
#include <lib/core/CHIPCore.h>
#include <lib/core/ErrorStr.h>
#include <lib/support/CHIPCounter.h>
#include <lib/support/TimeUtils.h>
#include <lib/support/UnitTestContext.h>
#include <lib/support/UnitTestRegistration.h>
#include <lib/support/UnitTestUtils.h>
#include <lib/support/logging/CHIPLogging.h>
#include <messaging/tests/MessagingContext.h>
#include <nlunit-test.h>
using namespace chip;
using namespace chip::app;
using namespace chip::app::Clusters;
namespace {
static uint8_t gDebugEventBuffer[4096];
static uint8_t gInfoEventBuffer[4096];
static uint8_t gCritEventBuffer[4096];
static chip::app::CircularEventBuffer gCircularEventBuffer[3];
class TestContext : public chip::Test::AppContext
{
public:
// Performs setup for each individual test in the test suite
CHIP_ERROR SetUp() override
{
const chip::app::LogStorageResources logStorageResources[] = {
{ &gDebugEventBuffer[0], sizeof(gDebugEventBuffer), chip::app::PriorityLevel::Debug },
{ &gInfoEventBuffer[0], sizeof(gInfoEventBuffer), chip::app::PriorityLevel::Info },
{ &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
};
ReturnErrorOnFailure(chip::Test::AppContext::SetUp());
CHIP_ERROR err = CHIP_NO_ERROR;
VerifyOrExit((err = mEventCounter.Init(0)) == CHIP_NO_ERROR,
ChipLogError(AppServer, "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format()));
chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
gCircularEventBuffer, logStorageResources, &mEventCounter);
exit:
return err;
}
// Performs teardown for each individual test in the test suite
void TearDown() override
{
chip::app::EventManagement::DestroyEventManagement();
chip::Test::AppContext::TearDown();
}
private:
MonotonicallyIncreasingCounter<EventNumber> mEventCounter;
};
uint32_t gIterationCount = 0;
nlTestSuite * gSuite = nullptr;
//
// The generated endpoint_config for the controller app has Endpoint 1
// already used in the fixed endpoint set of size 1. Consequently, let's use the next
// number higher than that for our dynamic test endpoint.
//
constexpr EndpointId kTestEndpointId = 2;
constexpr AttributeId kTestListLargeAttribute = 8; // This attribute will be larger than the event size we used in this test.
// The size of the attribute which is a bit larger than the size of event used in the test.
constexpr size_t kSizeOfLargeAttribute = 60;
class TestReadEvents
{
public:
TestReadEvents() {}
static void TestEventChunking(nlTestSuite * apSuite, void * apContext);
static void TestMixedEventsAndAttributesChunking(nlTestSuite * apSuite, void * apContext);
static void TestMixedEventsAndLargeAttributesChunking(nlTestSuite * apSuite, void * apContext);
private:
};
//clang-format off
DECLARE_DYNAMIC_ATTRIBUTE_LIST_BEGIN(testClusterAttrs)
DECLARE_DYNAMIC_ATTRIBUTE(0x00000001, INT8U, 1, 0), DECLARE_DYNAMIC_ATTRIBUTE(0x00000002, INT8U, 1, 0),
DECLARE_DYNAMIC_ATTRIBUTE(0x00000003, INT8U, 1, 0), DECLARE_DYNAMIC_ATTRIBUTE(0x00000004, INT8U, 1, 0),
DECLARE_DYNAMIC_ATTRIBUTE(0x00000005, INT8U, 1, 0), DECLARE_DYNAMIC_ATTRIBUTE_LIST_END();
DECLARE_DYNAMIC_CLUSTER_LIST_BEGIN(testEndpointClusters)
DECLARE_DYNAMIC_CLUSTER(Clusters::UnitTesting::Id, testClusterAttrs, ZAP_CLUSTER_MASK(SERVER), nullptr, nullptr),
DECLARE_DYNAMIC_CLUSTER_LIST_END;
DECLARE_DYNAMIC_ENDPOINT(testEndpoint, testEndpointClusters);
DECLARE_DYNAMIC_ATTRIBUTE_LIST_BEGIN(testClusterAttrsOnEndpoint4)
DECLARE_DYNAMIC_ATTRIBUTE(kTestListLargeAttribute, ARRAY, 1, 0), DECLARE_DYNAMIC_ATTRIBUTE_LIST_END();
DECLARE_DYNAMIC_CLUSTER_LIST_BEGIN(testEndpoint4Clusters)
DECLARE_DYNAMIC_CLUSTER(Clusters::UnitTesting::Id, testClusterAttrsOnEndpoint4, ZAP_CLUSTER_MASK(SERVER), nullptr, nullptr),
DECLARE_DYNAMIC_CLUSTER_LIST_END;
DECLARE_DYNAMIC_ENDPOINT(testEndpoint4, testEndpoint4Clusters);
//clang-format on
uint8_t sAnStringThatCanNeverFitIntoTheMTU[4096] = { 0 };
class TestReadCallback : public app::ReadClient::Callback
{
public:
TestReadCallback() : mBufferedCallback(*this) {}
void OnAttributeData(const app::ConcreteDataAttributePath & aPath, TLV::TLVReader * apData,
const app::StatusIB & aStatus) override;
void OnEventData(const app::EventHeader & aEventHeader, TLV::TLVReader * apData, const app::StatusIB * apStatus) override;
void OnDone(app::ReadClient * apReadClient) override;
void OnReportEnd() override { mOnReportEnd = true; }
void OnSubscriptionEstablished(SubscriptionId aSubscriptionId) override { mOnSubscriptionEstablished = true; }
uint32_t mAttributeCount = 0;
uint32_t mEventCount = 0;
bool mOnReportEnd = false;
bool mOnSubscriptionEstablished = false;
app::BufferedReadCallback mBufferedCallback;
};
void TestReadCallback::OnAttributeData(const app::ConcreteDataAttributePath & aPath, TLV::TLVReader * apData,
const app::StatusIB & aStatus)
{
if (aPath.mAttributeId == Globals::Attributes::GeneratedCommandList::Id)
{
app::DataModel::DecodableList<CommandId> v;
NL_TEST_ASSERT(gSuite, app::DataModel::Decode(*apData, v) == CHIP_NO_ERROR);
auto it = v.begin();
size_t arraySize = 0;
while (it.Next())
{
NL_TEST_ASSERT(gSuite, false);
}
NL_TEST_ASSERT(gSuite, it.GetStatus() == CHIP_NO_ERROR);
NL_TEST_ASSERT(gSuite, v.ComputeSize(&arraySize) == CHIP_NO_ERROR);
NL_TEST_ASSERT(gSuite, arraySize == 0);
}
else if (aPath.mAttributeId == Globals::Attributes::AcceptedCommandList::Id)
{
app::DataModel::DecodableList<CommandId> v;
NL_TEST_ASSERT(gSuite, app::DataModel::Decode(*apData, v) == CHIP_NO_ERROR);
auto it = v.begin();
size_t arraySize = 0;
while (it.Next())
{
NL_TEST_ASSERT(gSuite, false);
}
NL_TEST_ASSERT(gSuite, it.GetStatus() == CHIP_NO_ERROR);
NL_TEST_ASSERT(gSuite, v.ComputeSize(&arraySize) == CHIP_NO_ERROR);
NL_TEST_ASSERT(gSuite, arraySize == 0);
}
#if CHIP_CONFIG_ENABLE_EVENTLIST_ATTRIBUTE
else if (aPath.mAttributeId == Globals::Attributes::EventList::Id)
{
// Nothing to check for this one; depends on the endpoint.
}
#endif // CHIP_CONFIG_ENABLE_EVENTLIST_ATTRIBUTE
else if (aPath.mAttributeId == Globals::Attributes::AttributeList::Id)
{
// Nothing to check for this one; depends on the endpoint.
}
else if (aPath.mAttributeId == kTestListLargeAttribute)
{
app::DataModel::DecodableList<ByteSpan> v;
NL_TEST_ASSERT(gSuite, app::DataModel::Decode(*apData, v) == CHIP_NO_ERROR);
auto it = v.begin();
size_t arraySize = 0;
NL_TEST_ASSERT(gSuite, v.ComputeSize(&arraySize) == CHIP_NO_ERROR);
NL_TEST_ASSERT(gSuite, arraySize == 4);
}
else
{
uint8_t v;
NL_TEST_ASSERT(gSuite, app::DataModel::Decode(*apData, v) == CHIP_NO_ERROR);
NL_TEST_ASSERT(gSuite, v == (uint8_t) gIterationCount);
}
mAttributeCount++;
}
void TestReadCallback::OnEventData(const app::EventHeader & aEventHeader, TLV::TLVReader * apData, const app::StatusIB * aStatus)
{
VerifyOrReturn(apData != nullptr);
mEventCount++;
}
void TestReadCallback::OnDone(app::ReadClient *) {}
class TestAttrAccess : public app::AttributeAccessInterface
{
public:
// Register for the Test Cluster cluster on all endpoints.
TestAttrAccess() : AttributeAccessInterface(Optional<EndpointId>::Missing(), Clusters::UnitTesting::Id)
{
registerAttributeAccessOverride(this);
}
CHIP_ERROR Read(const app::ConcreteReadAttributePath & aPath, app::AttributeValueEncoder & aEncoder) override;
CHIP_ERROR Write(const app::ConcreteDataAttributePath & aPath, app::AttributeValueDecoder & aDecoder) override;
};
TestAttrAccess gAttrAccess;
CHIP_ERROR TestAttrAccess::Read(const app::ConcreteReadAttributePath & aPath, app::AttributeValueEncoder & aEncoder)
{
switch (aPath.mAttributeId)
{
case kTestListLargeAttribute:
return aEncoder.EncodeList([](const auto & encoder) {
for (int i = 0; i < 4; i++)
{
// When putting even numbers of list entries, there is a point (a range of iterations) that we can put an event
// between two list items in the same chunk.
ReturnErrorOnFailure(encoder.Encode(ByteSpan(sAnStringThatCanNeverFitIntoTheMTU, kSizeOfLargeAttribute)));
}
return CHIP_NO_ERROR;
});
default:
return aEncoder.Encode((uint8_t) gIterationCount);
}
}
CHIP_ERROR TestAttrAccess::Write(const app::ConcreteDataAttributePath & aPath, app::AttributeValueDecoder & aDecoder)
{
return CHIP_ERROR_UNSUPPORTED_CHIP_FEATURE;
}
namespace {
void GenerateEvents(nlTestSuite * apSuite, chip::EventNumber & firstEventNumber, chip::EventNumber & lastEventNumber)
{
CHIP_ERROR err = CHIP_NO_ERROR;
Clusters::UnitTesting::Events::TestEvent::Type content;
content.arg1 = static_cast<uint8_t>(gIterationCount);
for (int i = 0; i < 5; i++)
{
NL_TEST_ASSERT(apSuite, (err = app::LogEvent(content, kTestEndpointId, lastEventNumber)) == CHIP_NO_ERROR);
if (i == 0)
{
firstEventNumber = lastEventNumber;
}
}
}
} // namespace
/*
* This validates all the various corner cases encountered during chunking by
* artificially reducing the size of a packet buffer used to encode attribute & event data
* to force chunking to happen over multiple packets even with a small number of attributes or events
* and then slowly increasing the available size by 1 byte in each test iteration and re-running
* the report generation logic. This 1-byte incremental approach sweeps through from a base scenario of
* N attributes fitting in a report, to eventually resulting in N+1 attributes or events fitting in a report.
* This will cause all the various corner cases encountered of closing out the various containers within
* the report and thoroughly and definitely validate those edge cases.
*
* Importantly, this test tries to re-use *as much as possible* the actual IM constructs used by real
* server-side applications. Consequently, this is why it registers a dynamic endpoint + fake attribute access + fake event
* generation interface to simulate faithfully a real application. This ensures validation of as much production logic pathways
* as we can possibly cover.
*
*/
void TestReadEvents::TestEventChunking(nlTestSuite * apSuite, void * apContext)
{
TestContext & ctx = *static_cast<TestContext *>(apContext);
auto sessionHandle = ctx.GetSessionBobToAlice();
app::InteractionModelEngine * engine = app::InteractionModelEngine::GetInstance();
// Initialize the ember side server logic
InitDataModelHandler();
// Register our fake dynamic endpoint.
DataVersion dataVersionStorage[ArraySize(testEndpointClusters)];
emberAfSetDynamicEndpoint(0, kTestEndpointId, &testEndpoint, Span<DataVersion>(dataVersionStorage));
chip::EventNumber firstEventNumber;
chip::EventNumber lastEventNumber;
GenerateEvents(apSuite, firstEventNumber, lastEventNumber);
app::EventPathParams eventPath;
eventPath.mEndpointId = kTestEndpointId;
eventPath.mClusterId = app::Clusters::UnitTesting::Id;
app::ReadPrepareParams readParams(sessionHandle);
readParams.mpEventPathParamsList = &eventPath;
readParams.mEventPathParamsListSize = 1;
readParams.mEventNumber.SetValue(firstEventNumber);
// Since we will always read from the first event, we only generate event once.
//
// We've empirically determined that by reserving 950 bytes in the packet buffer, we can fit 2
// AttributeDataIBs into the packet. ~30-40 bytes covers a single EventDataIB, but let's 2-3x that
// to ensure we'll sweep from fitting 2 IBs to 3-4 IBs.
//
for (int i = 100; i > 0; i--)
{
TestReadCallback readCallback;
ChipLogDetail(DataManagement, "Running iteration %d\n", i);
gIterationCount = (uint32_t) i;
app::InteractionModelEngine::GetInstance()->GetReportingEngine().SetWriterReserved(static_cast<uint32_t>(800 + i));
app::ReadClient readClient(engine, &ctx.GetExchangeManager(), readCallback.mBufferedCallback,
app::ReadClient::InteractionType::Read);
NL_TEST_ASSERT(apSuite, readClient.SendRequest(readParams) == CHIP_NO_ERROR);
ctx.DrainAndServiceIO();
NL_TEST_ASSERT(apSuite, readCallback.mEventCount == static_cast<uint32_t>((lastEventNumber - firstEventNumber) + 1));
NL_TEST_ASSERT(apSuite, ctx.GetExchangeManager().GetNumActiveExchanges() == 0);
//
// Stop the test if we detected an error. Otherwise, it'll be difficult to read the logs.
//
if (apSuite->flagError)
{
break;
}
}
emberAfClearDynamicEndpoint(0);
}
// Similar to the tests above, but it will read attributes AND events
void TestReadEvents::TestMixedEventsAndAttributesChunking(nlTestSuite * apSuite, void * apContext)
{
TestContext & ctx = *static_cast<TestContext *>(apContext);
auto sessionHandle = ctx.GetSessionBobToAlice();
app::InteractionModelEngine * engine = app::InteractionModelEngine::GetInstance();
// Initialize the ember side server logic
InitDataModelHandler();
// Register our fake dynamic endpoint.
DataVersion dataVersionStorage[ArraySize(testEndpointClusters)];
emberAfSetDynamicEndpoint(0, kTestEndpointId, &testEndpoint, Span<DataVersion>(dataVersionStorage));
chip::EventNumber firstEventNumber;
chip::EventNumber lastEventNumber;
// We will always read from the first event, so it is enough to only generate events once.
GenerateEvents(apSuite, firstEventNumber, lastEventNumber);
app::EventPathParams eventPath;
app::AttributePathParams attributePath(kTestEndpointId, app::Clusters::UnitTesting::Id);
eventPath.mEndpointId = kTestEndpointId;
eventPath.mClusterId = app::Clusters::UnitTesting::Id;
app::ReadPrepareParams readParams(sessionHandle);
readParams.mpAttributePathParamsList = &attributePath;
readParams.mAttributePathParamsListSize = 1;
readParams.mpEventPathParamsList = &eventPath;
readParams.mEventPathParamsListSize = 1;
readParams.mEventNumber.SetValue(firstEventNumber);
//
// We've empirically determined that by reserving 950 bytes in the packet buffer, we can fit 2
// AttributeDataIBs into the packet. ~30-40 bytes covers a single EventDataIB, but let's 2-3x that
// to ensure we'll sweep from fitting 2 IBs to 3-4 IBs.
//
for (int i = 100; i > 0; i--)
{
TestReadCallback readCallback;
ChipLogDetail(DataManagement, "Running iteration %d\n", i);
gIterationCount = (uint32_t) i;
app::InteractionModelEngine::GetInstance()->GetReportingEngine().SetWriterReserved(static_cast<uint32_t>(800 + i));
app::ReadClient readClient(engine, &ctx.GetExchangeManager(), readCallback.mBufferedCallback,
app::ReadClient::InteractionType::Read);
NL_TEST_ASSERT(apSuite, readClient.SendRequest(readParams) == CHIP_NO_ERROR);
ctx.DrainAndServiceIO();
//
// Always returns the same number of attributes read (5 + revision + GlobalAttributesNotInMetadata).
//
NL_TEST_ASSERT(apSuite, readCallback.mOnReportEnd);
NL_TEST_ASSERT(apSuite, readCallback.mAttributeCount == 6 + ArraySize(GlobalAttributesNotInMetadata));
NL_TEST_ASSERT(apSuite, readCallback.mEventCount == static_cast<uint32_t>(lastEventNumber - firstEventNumber + 1));
NL_TEST_ASSERT(apSuite, ctx.GetExchangeManager().GetNumActiveExchanges() == 0);
//
// Stop the test if we detected an error. Otherwise, it'll be difficult to read the logs.
//
if (apSuite->flagError)
{
break;
}
}
emberAfClearDynamicEndpoint(0);
}
// Similar to the tests above, however, there is one another case -- the event payload is very large usually, so when it is failed
// to encode an attribute, it is usually impossible to encode a event data, so we cannot verify the case when events and attributes
// can be encoded in to one chunk in the tests above. This test will force it by reading only one attribtue and read many events.
void TestReadEvents::TestMixedEventsAndLargeAttributesChunking(nlTestSuite * apSuite, void * apContext)
{
TestContext & ctx = *static_cast<TestContext *>(apContext);
auto sessionHandle = ctx.GetSessionBobToAlice();
app::InteractionModelEngine * engine = app::InteractionModelEngine::GetInstance();
// Initialize the ember side server logic
InitDataModelHandler();
// Register our fake dynamic endpoint.
DataVersion dataVersionStorage[ArraySize(testEndpointClusters)];
emberAfSetDynamicEndpoint(0, kTestEndpointId, &testEndpoint4, Span<DataVersion>(dataVersionStorage));
chip::EventNumber firstEventNumber;
chip::EventNumber lastEventNumber;
// We will always read from the first event, so it is enough to only generate events once.
GenerateEvents(apSuite, firstEventNumber, lastEventNumber);
app::EventPathParams eventPath;
app::AttributePathParams attributePath(kTestEndpointId, app::Clusters::UnitTesting::Id, kTestListLargeAttribute);
eventPath.mEndpointId = kTestEndpointId;
eventPath.mClusterId = app::Clusters::UnitTesting::Id;
app::ReadPrepareParams readParams(sessionHandle);
readParams.mpAttributePathParamsList = &attributePath;
readParams.mAttributePathParamsListSize = 1;
readParams.mpEventPathParamsList = &eventPath;
readParams.mEventPathParamsListSize = 1;
readParams.mEventNumber.SetValue(firstEventNumber);
//
// We've empirically determined that by reserving 950 bytes in the packet buffer, we can fit 2
// AttributeDataIBs into the packet. ~30-40 bytes covers a single EventDataIB, but let's 2-3x that
// to ensure we'll sweep from fitting 2 IBs to 3-4 IBs.
//
for (int i = 100; i > 0; i--)
{
TestReadCallback readCallback;
ChipLogDetail(DataManagement, "Running iteration %d\n", i);
gIterationCount = (uint32_t) i;
app::InteractionModelEngine::GetInstance()->GetReportingEngine().SetWriterReserved(static_cast<uint32_t>(800 + i));
app::ReadClient readClient(engine, &ctx.GetExchangeManager(), readCallback.mBufferedCallback,
app::ReadClient::InteractionType::Read);
NL_TEST_ASSERT(apSuite, readClient.SendRequest(readParams) == CHIP_NO_ERROR);
ctx.DrainAndServiceIO();
NL_TEST_ASSERT(apSuite, readCallback.mOnReportEnd);
NL_TEST_ASSERT(apSuite, readCallback.mAttributeCount == 1);
NL_TEST_ASSERT(apSuite, readCallback.mEventCount == static_cast<uint32_t>(lastEventNumber - firstEventNumber + 1));
NL_TEST_ASSERT(apSuite, ctx.GetExchangeManager().GetNumActiveExchanges() == 0);
//
// Stop the test if we detected an error. Otherwise, it'll be difficult to read the logs.
//
if (apSuite->flagError)
{
break;
}
}
emberAfClearDynamicEndpoint(0);
}
const nlTest sTests[] = {
NL_TEST_DEF("TestEventChunking", TestReadEvents::TestEventChunking),
NL_TEST_DEF("TestMixedEventsAndAttributesChunking", TestReadEvents::TestMixedEventsAndAttributesChunking),
NL_TEST_DEF("TestMixedEventsAndLargeAttributesChunking", TestReadEvents::TestMixedEventsAndLargeAttributesChunking),
NL_TEST_SENTINEL(),
};
nlTestSuite sSuite = {
"TestEventChunking",
&sTests[0],
TestContext::nlTestSetUpTestSuite,
TestContext::nlTestTearDownTestSuite,
TestContext::nlTestSetUp,
TestContext::nlTestTearDown,
};
} // namespace
int TestEventChunkingTests()
{
gSuite = &sSuite;
return chip::ExecuteTestsWithContext<TestContext>(&sSuite);
}
CHIP_REGISTER_TEST_SUITE(TestEventChunkingTests)