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/*
*
* Copyright (c) 2022 Project CHIP Authors
* All rights reserved.
*
* Licensed under the Apache License, Version 2.0 (the "License");
* you may not use this file except in compliance with the License.
* You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*/
/**
* @file
* This file implements a test for CHIP Interaction Model Event logging
*
*/
#include <app/EventLoggingDelegate.h>
#include <app/EventLoggingTypes.h>
#include <app/EventManagement.h>
#include <app/InteractionModelEngine.h>
#include <app/tests/AppTestContext.h>
#include <lib/core/CHIPCore.h>
#include <lib/core/ErrorStr.h>
#include <lib/core/TLV.h>
#include <lib/core/TLVDebug.h>
#include <lib/core/TLVUtilities.h>
#include <lib/support/CHIPCounter.h>
#include <lib/support/CodeUtils.h>
#include <lib/support/EnforceFormat.h>
#include <lib/support/UnitTestContext.h>
#include <lib/support/UnitTestRegistration.h>
#include <lib/support/logging/Constants.h>
#include <messaging/ExchangeContext.h>
#include <messaging/Flags.h>
#include <platform/CHIPDeviceLayer.h>
#include <system/TLVPacketBufferBackingStore.h>
#include <nlunit-test.h>
namespace {
static uint8_t gDebugEventBuffer[2048];
static uint8_t gInfoEventBuffer[2048];
static uint8_t gCritEventBuffer[2048];
static chip::app::CircularEventBuffer gCircularEventBuffer[3];
class TestContext : public chip::Test::AppContext
{
public:
// Performs setup for each individual test in the test suite
void SetUp() override
{
const chip::app::LogStorageResources logStorageResources[] = {
{ &gDebugEventBuffer[0], sizeof(gDebugEventBuffer), chip::app::PriorityLevel::Debug },
{ &gInfoEventBuffer[0], sizeof(gInfoEventBuffer), chip::app::PriorityLevel::Info },
{ &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
};
chip::Test::AppContext::SetUp();
CHIP_ERROR err = CHIP_NO_ERROR;
// TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
VerifyOrDieWithMsg((err = mEventCounter.Init(0)) == CHIP_NO_ERROR, AppServer,
"Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format());
chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
gCircularEventBuffer, logStorageResources, &mEventCounter);
}
// Performs teardown for each individual test in the test suite
void TearDown() override
{
chip::app::EventManagement::DestroyEventManagement();
chip::Test::AppContext::TearDown();
}
private:
chip::MonotonicallyIncreasingCounter<chip::EventNumber> mEventCounter;
};
class TestEventGenerator : public chip::app::EventLoggingDelegate
{
public:
CHIP_ERROR WriteEvent(chip::TLV::TLVWriter & aWriter)
{
chip::TLV::TLVType dataContainerType;
ReturnErrorOnFailure(aWriter.StartContainer(chip::TLV::ContextTag(chip::to_underlying(chip::app::EventDataIB::Tag::kData)),
chip::TLV::kTLVType_Structure, dataContainerType));
ReturnErrorOnFailure(aWriter.Put(chip::TLV::ContextTag(1), static_cast<uint32_t>(1)));
ReturnErrorOnFailure(aWriter.Put(chip::TLV::ContextTag(2), static_cast<uint32_t>(2)));
return aWriter.EndContainer(dataContainerType);
}
};
static void CheckLogEventOverFlow(nlTestSuite * apSuite, void * apContext)
{
CHIP_ERROR err = CHIP_NO_ERROR;
chip::EventNumber oldEid = 0;
chip::EventNumber eid = 0;
chip::app::EventOptions options;
TestEventGenerator testEventGenerator;
chip::EndpointId testEndpointId = 1;
chip::ClusterId testClusterId = 0x00000006;
chip::EventId testEvent = 1;
options.mPath = { testEndpointId, testClusterId, testEvent };
options.mPriority = chip::app::PriorityLevel::Debug;
chip::app::EventManagement & logMgmt = chip::app::EventManagement::GetInstance();
int alternate = 0;
for (int i = 0; i < 500; i++)
{
switch (alternate)
{
case 0:
options.mPriority = chip::app::PriorityLevel::Critical;
break;
case 1:
options.mPriority = chip::app::PriorityLevel::Debug;
break;
case 2:
options.mPriority = chip::app::PriorityLevel::Critical;
break;
case 3:
options.mPriority = chip::app::PriorityLevel::Debug;
break;
case 4:
options.mPriority = chip::app::PriorityLevel::Critical;
break;
case 5:
options.mPriority = chip::app::PriorityLevel::Debug;
break;
case 6:
options.mPriority = chip::app::PriorityLevel::Critical;
break;
case 7:
options.mPriority = chip::app::PriorityLevel::Debug;
break;
case 8:
options.mPriority = chip::app::PriorityLevel::Critical;
break;
case 9:
options.mPriority = chip::app::PriorityLevel::Debug;
break;
}
alternate = i % 10;
err = logMgmt.LogEvent(&testEventGenerator, options, eid);
NL_TEST_ASSERT(apSuite, err == CHIP_NO_ERROR);
if (eid > 0)
{
NL_TEST_ASSERT(apSuite, eid == oldEid + 1);
oldEid = eid;
}
}
}
const nlTest sTests[] = { NL_TEST_DEF("CheckLogEventOverFlow", CheckLogEventOverFlow), NL_TEST_SENTINEL() };
// clang-format off
nlTestSuite sSuite =
{
"TestEventOverflow",
&sTests[0],
TestContext::nlTestSetUpTestSuite,
TestContext::nlTestTearDownTestSuite,
TestContext::nlTestSetUp,
TestContext::nlTestTearDown,
};
// clang-format on
} // namespace
int TestEventOverflow()
{
return chip::ExecuteTestsWithContext<TestContext>(&sSuite);
}
CHIP_REGISTER_TEST_SUITE(TestEventOverflow)