| /* |
| * |
| * Copyright (c) 2023 Project CHIP Authors |
| * |
| * Licensed under the Apache License, Version 2.0 (the "License"); |
| * you may not use this file except in compliance with the License. |
| * You may obtain a copy of the License at |
| * |
| * http://www.apache.org/licenses/LICENSE-2.0 |
| * |
| * Unless required by applicable law or agreed to in writing, software |
| * distributed under the License is distributed on an "AS IS" BASIS, |
| * WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied. |
| * See the License for the specific language governing permissions and |
| * limitations under the License. |
| */ |
| |
| #pragma once |
| |
| #include <app-common/zap-generated/cluster-objects.h> |
| #include <app/TestEventTriggerDelegate.h> |
| |
| namespace chip { |
| |
| /* |
| * These Test EventTrigger values are specified in the TC_EEVSE test plan |
| * and are defined conditions used in test events. |
| * |
| * They are sent along with the enableKey (manufacturer defined secret) |
| * in the General Diagnostic cluster TestEventTrigger command |
| */ |
| enum class EnergyEvseTrigger : uint64_t |
| { |
| // Scenarios |
| // Basic Functionality Test Event | Simulate installation with _{A_CIRCUIT_CAPACITY}_=32A and |
| // _{A_USER_MAXIMUM_CHARGE_CURRENT}_=32A |
| kBasicFunctionality = 0x0099000000000000, |
| // Basic Functionality Test Event Clear | End simulation of installation |
| kBasicFunctionalityClear = 0x0099000000000001, |
| // EV Plugged-in Test Event | Simulate plugging the EV into the EVSE using a cable of 63A capacity |
| kEVPluggedIn = 0x0099000000000002, |
| // EV Plugged-in Test Event Clear | Simulate unplugging the EV |
| kEVPluggedInClear = 0x0099000000000003, |
| // EV Charge Demand Test Event | Simulate the EV presenting charge demand to the EVSE |
| kEVChargeDemand = 0x0099000000000004, |
| // EV Charge Demand Test Event Clear | Simulate the EV becoming fully charged |
| kEVChargeDemandClear = 0x0099000000000005, |
| // EVSE has a GroundFault fault |
| kEVSEGroundFault = 0x0099000000000010, |
| // EVSE has a OverTemperature fault |
| kEVSEOverTemperatureFault = 0x0099000000000011, |
| // EVSE faults have cleared |
| kEVSEFaultClear = 0x0099000000000012, |
| // EVSE Diagnostics Complete | Simulate diagnostics have been completed and return to normal |
| kEVSEDiagnosticsComplete = 0x0099000000000020, |
| }; |
| |
| class EnergyEvseTestEventTriggerDelegate : public TestEventTriggerDelegate |
| { |
| public: |
| /** |
| * This class expects the enableKey ByteSpan to be valid forever. |
| * Typically this feature is only enabled in certification testing |
| * and uses a static secret key in the device for testing (e.g. in factory data) |
| */ |
| explicit EnergyEvseTestEventTriggerDelegate(const ByteSpan & enableKey, TestEventTriggerDelegate * otherDelegate) : |
| mEnableKey(enableKey), mOtherDelegate(otherDelegate) |
| {} |
| |
| /* This function returns True if the enableKey received in the TestEventTrigger command |
| * matches the value passed into the constructor. |
| */ |
| bool DoesEnableKeyMatch(const ByteSpan & enableKey) const override; |
| |
| /** This function must return True if the eventTrigger is recognised and handled |
| * It must return False to allow a higher level TestEvent handler to check other |
| * clusters that may handle it. |
| */ |
| CHIP_ERROR HandleEventTrigger(uint64_t eventTrigger) override; |
| |
| private: |
| ByteSpan mEnableKey; |
| TestEventTriggerDelegate * mOtherDelegate; |
| }; |
| |
| } // namespace chip |
| |
| /** |
| * @brief User handler for handling the test event trigger |
| * |
| * @note If TestEventTrigger is enabled, it needs to be implemented in the app |
| * |
| * @param eventTrigger Event trigger to handle |
| * |
| * @retval true on success |
| * @retval false if error happened |
| */ |
| bool HandleEnergyEvseTestEventTrigger(uint64_t eventTrigger); |