| /* |
| * |
| * Copyright (c) 2023 Project CHIP Authors |
| * All rights reserved. |
| * |
| * Licensed under the Apache License, Version 2.0 (the "License"); |
| * you may not use this file except in compliance with the License. |
| * You may obtain a copy of the License at |
| * |
| * http://www.apache.org/licenses/LICENSE-2.0 |
| * |
| * Unless required by applicable law or agreed to in writing, software |
| * distributed under the License is distributed on an "AS IS" BASIS, |
| * WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied. |
| * See the License for the specific language governing permissions and |
| * limitations under the License. |
| */ |
| |
| #include "app-common/zap-generated/ids/Clusters.h" |
| #include "app/ClusterStateCache.h" |
| #include <app-common/zap-generated/cluster-objects.h> |
| #include <app/AppConfig.h> |
| #include <app/BufferedReadCallback.h> |
| #include <app/CommandHandlerInterface.h> |
| #include <app/EventLogging.h> |
| #include <app/InteractionModelEngine.h> |
| #include <app/data-model/Decode.h> |
| #include <app/tests/AppTestContext.h> |
| #include <app/util/DataModelHandler.h> |
| #include <app/util/attribute-storage.h> |
| #include <controller/InvokeInteraction.h> |
| #include <lib/core/ErrorStr.h> |
| #include <lib/support/TimeUtils.h> |
| #include <lib/support/UnitTestContext.h> |
| #include <lib/support/UnitTestRegistration.h> |
| #include <lib/support/UnitTestUtils.h> |
| #include <lib/support/logging/CHIPLogging.h> |
| #include <messaging/tests/MessagingContext.h> |
| #include <nlunit-test.h> |
| |
| using namespace chip; |
| using namespace chip::app; |
| using namespace chip::app::Clusters; |
| |
| namespace { |
| |
| static uint8_t gDebugEventBuffer[4096]; |
| static uint8_t gInfoEventBuffer[4096]; |
| static uint8_t gCritEventBuffer[4096]; |
| static chip::app::CircularEventBuffer gCircularEventBuffer[3]; |
| |
| class TestContext : public chip::Test::AppContext |
| { |
| public: |
| // Performs setup for each individual test in the test suite |
| void SetUp() override |
| { |
| const chip::app::LogStorageResources logStorageResources[] = { |
| { &gDebugEventBuffer[0], sizeof(gDebugEventBuffer), chip::app::PriorityLevel::Debug }, |
| { &gInfoEventBuffer[0], sizeof(gInfoEventBuffer), chip::app::PriorityLevel::Info }, |
| { &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical }, |
| }; |
| |
| chip::Test::AppContext::SetUp(); |
| |
| CHIP_ERROR err = CHIP_NO_ERROR; |
| // TODO: use ASSERT_EQ, once transition to pw_unit_test is complete |
| VerifyOrDieWithMsg((err = mEventCounter.Init(0)) == CHIP_NO_ERROR, AppServer, |
| "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format()); |
| chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources), |
| gCircularEventBuffer, logStorageResources, &mEventCounter); |
| } |
| |
| // Performs teardown for each individual test in the test suite |
| void TearDown() override |
| { |
| chip::app::EventManagement::DestroyEventManagement(); |
| chip::Test::AppContext::TearDown(); |
| } |
| |
| private: |
| MonotonicallyIncreasingCounter<EventNumber> mEventCounter; |
| }; |
| |
| nlTestSuite * gSuite = nullptr; |
| |
| // |
| // The generated endpoint_config for the controller app has Endpoint 1 |
| // already used in the fixed endpoint set of size 1. Consequently, let's use the next |
| // number higher than that for our dynamic test endpoint. |
| // |
| constexpr EndpointId kTestEndpointId = 2; |
| |
| class TestReadEvents |
| { |
| public: |
| TestReadEvents() {} |
| static void TestEventNumberCaching(nlTestSuite * apSuite, void * apContext); |
| |
| private: |
| }; |
| |
| //clang-format off |
| DECLARE_DYNAMIC_ATTRIBUTE_LIST_BEGIN(testClusterAttrs) |
| DECLARE_DYNAMIC_ATTRIBUTE_LIST_END(); |
| |
| DECLARE_DYNAMIC_CLUSTER_LIST_BEGIN(testEndpointClusters) |
| DECLARE_DYNAMIC_CLUSTER(Clusters::UnitTesting::Id, testClusterAttrs, ZAP_CLUSTER_MASK(SERVER), nullptr, nullptr), |
| DECLARE_DYNAMIC_CLUSTER_LIST_END; |
| |
| DECLARE_DYNAMIC_ENDPOINT(testEndpoint, testEndpointClusters); |
| |
| //clang-format on |
| |
| class TestReadCallback : public app::ClusterStateCache::Callback |
| { |
| public: |
| TestReadCallback() : mClusterCacheAdapter(*this, Optional<EventNumber>::Missing(), false /*cacheData*/) {} |
| void OnDone(app::ReadClient *) override {} |
| |
| void OnEventData(const EventHeader & aEventHeader, TLV::TLVReader * apData, const StatusIB * apStatus) override |
| { |
| ++mEventsSeen; |
| } |
| |
| app::ClusterStateCache mClusterCacheAdapter; |
| |
| size_t mEventsSeen = 0; |
| }; |
| |
| namespace { |
| |
| void GenerateEvents(nlTestSuite * apSuite, chip::EventNumber & firstEventNumber, chip::EventNumber & lastEventNumber) |
| { |
| CHIP_ERROR err = CHIP_NO_ERROR; |
| static uint8_t generationCount = 0; |
| |
| Clusters::UnitTesting::Events::TestEvent::Type content; |
| |
| for (int i = 0; i < 5; i++) |
| { |
| content.arg1 = static_cast<uint8_t>(generationCount++); |
| NL_TEST_ASSERT(apSuite, (err = app::LogEvent(content, kTestEndpointId, lastEventNumber)) == CHIP_NO_ERROR); |
| if (i == 0) |
| { |
| firstEventNumber = lastEventNumber; |
| } |
| } |
| } |
| |
| } // namespace |
| |
| /* |
| * This validates event caching by forcing a bunch of events to get generated, then reading them back |
| * and upon completion of that operation, check the received version from cache, and note that cache would store |
| * correpsonding attribute data since data cache is disabled. |
| * |
| */ |
| void TestReadEvents::TestEventNumberCaching(nlTestSuite * apSuite, void * apContext) |
| { |
| TestContext & ctx = *static_cast<TestContext *>(apContext); |
| auto sessionHandle = ctx.GetSessionBobToAlice(); |
| app::InteractionModelEngine * engine = app::InteractionModelEngine::GetInstance(); |
| |
| // Initialize the ember side server logic |
| InitDataModelHandler(); |
| |
| // Register our fake dynamic endpoint. |
| DataVersion dataVersionStorage[ArraySize(testEndpointClusters)]; |
| emberAfSetDynamicEndpoint(0, kTestEndpointId, &testEndpoint, Span<DataVersion>(dataVersionStorage)); |
| |
| chip::EventNumber firstEventNumber; |
| chip::EventNumber lastEventNumber; |
| |
| GenerateEvents(apSuite, firstEventNumber, lastEventNumber); |
| NL_TEST_ASSERT(apSuite, lastEventNumber > firstEventNumber); |
| |
| app::EventPathParams eventPath; |
| eventPath.mEndpointId = kTestEndpointId; |
| eventPath.mClusterId = app::Clusters::UnitTesting::Id; |
| app::ReadPrepareParams readParams(sessionHandle); |
| |
| readParams.mpEventPathParamsList = &eventPath; |
| readParams.mEventPathParamsListSize = 1; |
| readParams.mEventNumber.SetValue(firstEventNumber); |
| |
| TestReadCallback readCallback; |
| |
| { |
| Optional<EventNumber> highestEventNumber; |
| readCallback.mClusterCacheAdapter.GetHighestReceivedEventNumber(highestEventNumber); |
| NL_TEST_ASSERT(apSuite, !highestEventNumber.HasValue()); |
| app::ReadClient readClient(engine, &ctx.GetExchangeManager(), readCallback.mClusterCacheAdapter.GetBufferedCallback(), |
| app::ReadClient::InteractionType::Read); |
| |
| NL_TEST_ASSERT(apSuite, readClient.SendRequest(readParams) == CHIP_NO_ERROR); |
| |
| ctx.DrainAndServiceIO(); |
| |
| NL_TEST_ASSERT(apSuite, readCallback.mEventsSeen == lastEventNumber - firstEventNumber + 1); |
| |
| readCallback.mClusterCacheAdapter.ForEachEventData([&apSuite](const app::EventHeader & header) { |
| // We are not caching data. |
| NL_TEST_ASSERT(apSuite, false); |
| |
| return CHIP_NO_ERROR; |
| }); |
| |
| readCallback.mClusterCacheAdapter.GetHighestReceivedEventNumber(highestEventNumber); |
| NL_TEST_ASSERT(apSuite, highestEventNumber.HasValue() && highestEventNumber.Value() == lastEventNumber); |
| } |
| |
| // |
| // Clear out the event cache and set its highest received event number to a non zero value. Validate that |
| // we don't receive events except ones larger than that value. |
| // |
| { |
| app::ReadClient readClient(engine, &ctx.GetExchangeManager(), readCallback.mClusterCacheAdapter.GetBufferedCallback(), |
| app::ReadClient::InteractionType::Read); |
| |
| readCallback.mClusterCacheAdapter.ClearEventCache(true); |
| Optional<EventNumber> highestEventNumber; |
| readCallback.mClusterCacheAdapter.GetHighestReceivedEventNumber(highestEventNumber); |
| NL_TEST_ASSERT(apSuite, !highestEventNumber.HasValue()); |
| |
| const EventNumber kHighestEventNumberSeen = lastEventNumber - 1; |
| NL_TEST_ASSERT(apSuite, kHighestEventNumberSeen < lastEventNumber); |
| |
| readCallback.mClusterCacheAdapter.SetHighestReceivedEventNumber(kHighestEventNumberSeen); |
| |
| readCallback.mEventsSeen = 0; |
| |
| readParams.mEventNumber.ClearValue(); |
| NL_TEST_ASSERT(apSuite, !readParams.mEventNumber.HasValue()); |
| NL_TEST_ASSERT(apSuite, readClient.SendRequest(readParams) == CHIP_NO_ERROR); |
| |
| ctx.DrainAndServiceIO(); |
| |
| // We should only get events with event numbers larger than kHighestEventNumberSeen. |
| NL_TEST_ASSERT(apSuite, readCallback.mEventsSeen == lastEventNumber - kHighestEventNumberSeen); |
| |
| readCallback.mClusterCacheAdapter.ForEachEventData([&apSuite](const app::EventHeader & header) { |
| // We are not caching data. |
| NL_TEST_ASSERT(apSuite, false); |
| |
| return CHIP_NO_ERROR; |
| }); |
| |
| readCallback.mClusterCacheAdapter.GetHighestReceivedEventNumber(highestEventNumber); |
| NL_TEST_ASSERT(apSuite, highestEventNumber.HasValue() && highestEventNumber.Value() == lastEventNumber); |
| } |
| NL_TEST_ASSERT(apSuite, ctx.GetExchangeManager().GetNumActiveExchanges() == 0); |
| |
| emberAfClearDynamicEndpoint(0); |
| } |
| |
| const nlTest sTests[] = { |
| NL_TEST_DEF("TestEventNumberCaching", TestReadEvents::TestEventNumberCaching), |
| NL_TEST_SENTINEL(), |
| }; |
| |
| // clang-format off |
| nlTestSuite sSuite = |
| { |
| "TestEventNumberCaching", |
| &sTests[0], |
| TestContext::nlTestSetUpTestSuite, |
| TestContext::nlTestTearDownTestSuite, |
| TestContext::nlTestSetUp, |
| TestContext::nlTestTearDown, |
| }; |
| // clang-format on |
| |
| } // namespace |
| |
| int TestEventNumberCaching() |
| { |
| gSuite = &sSuite; |
| return chip::ExecuteTestsWithContext<TestContext>(&sSuite); |
| } |
| |
| CHIP_REGISTER_TEST_SUITE(TestEventNumberCaching) |