blob: 29c4a6eda75efd83a2f86e0509fb3c60da89531e [file] [log] [blame]
/*
* Copyright (c) 2021 Project CHIP Authors
*
* Licensed under the Apache License, Version 2.0 (the "License");
* you may not use this file except in compliance with the License.
* You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*/
#include <system/SystemConfig.h>
#include <lib/core/ErrorStr.h>
#include <lib/support/CodeUtils.h>
#include <lib/support/UnitTestRegistration.h>
#include <nlunit-test.h>
#include <platform/CHIPDeviceLayer.h>
static void IncrementIntCounter(chip::System::Layer *, void * state)
{
++(*static_cast<int *>(state));
}
static void StopEventLoop(chip::System::Layer *, void *)
{
chip::DeviceLayer::PlatformMgr().StopEventLoopTask();
}
static void CheckScheduleWorkTwice(nlTestSuite * inSuite, void * aContext)
{
int * callCount = new int(0);
NL_TEST_ASSERT(inSuite, chip::DeviceLayer::SystemLayer().ScheduleWork(IncrementIntCounter, callCount) == CHIP_NO_ERROR);
NL_TEST_ASSERT(inSuite, chip::DeviceLayer::SystemLayer().ScheduleWork(IncrementIntCounter, callCount) == CHIP_NO_ERROR);
NL_TEST_ASSERT(inSuite, chip::DeviceLayer::SystemLayer().ScheduleWork(StopEventLoop, nullptr) == CHIP_NO_ERROR);
chip::DeviceLayer::PlatformMgr().RunEventLoop();
NL_TEST_ASSERT(inSuite, *callCount == 2);
delete callCount;
}
// Test Suite
/**
* Test Suite. It lists all the test functions.
*/
// clang-format off
static const nlTest sTests[] =
{
NL_TEST_DEF("System::TestScheduleWorkTwice", CheckScheduleWorkTwice),
NL_TEST_SENTINEL()
};
// clang-format on
static int TestSetup(void * aContext);
static int TestTeardown(void * aContext);
// clang-format off
static nlTestSuite kTheSuite =
{
"chip-system-schedule-work",
&sTests[0],
TestSetup,
TestTeardown
};
// clang-format on
/**
* Set up the test suite.
*/
static int TestSetup(void * aContext)
{
if (chip::Platform::MemoryInit() != CHIP_NO_ERROR)
{
return FAILURE;
}
if (chip::DeviceLayer::PlatformMgr().InitChipStack() != CHIP_NO_ERROR)
return FAILURE;
return (SUCCESS);
}
/**
* Tear down the test suite.
* Free memory reserved at TestSetup.
*/
static int TestTeardown(void * aContext)
{
chip::DeviceLayer::PlatformMgr().Shutdown();
chip::Platform::MemoryShutdown();
return (SUCCESS);
}
int TestSystemScheduleWork()
{
// Run test suit againt one lContext.
nlTestRunner(&kTheSuite, nullptr);
return nlTestRunnerStats(&kTheSuite);
}
CHIP_REGISTER_TEST_SUITE(TestSystemScheduleWork)