| commit | 0c87784c84af451828c561be339547dfb39fd530 | [log] [tgz] |
|---|---|---|
| author | Qiu Peiyang <peiyangx.qiu@intel.com> | Fri Feb 03 15:41:04 2017 +0800 |
| committer | Anas Nashif <nashif@linux.intel.com> | Sun Feb 12 01:04:09 2017 +0000 |
| tree | 102d00843a85c77b2b1259f2b4c1496b61a45ad2 | |
| parent | bc2faf3737d219b59221c4a381ada6e16644c791 [diff] |
tests/gpio: fix test GPIO_INT_EDGE bug When test GPIO_INT_EDGE, there is no code to skip GPIO_INT_LEVEL and jump to the end of the function. So GPIO_INT_LEVEL will always be checked (Besides, it't always true), even if it's testing GPIO_INT_EDGE, which will cause GPIO_INT_EDGE cases fail. Add a goto statement for GPIO_INT_EDGE to skip GPIO_INT_LEVEL. Jira: ZEP-1685 Change-Id: I10ce21c04c49f34aafdc2cd2f60f3e5377d6f1f5 Signed-off-by: Qiu Peiyang <peiyangx.qiu@intel.com>