tests: drivers: device clock controls for stm32n6 series

Add device clock configuration tests for STM32N6 series boards.
These tests cover ADC, I2C and SPI, using ADC1, I2C1 and SPI5 that are
connected on nucleo_n657x0_q and stm32n6570_dk boards.

Signed-off-by: Etienne Carriere <etienne.carriere@st.com>
12 files changed