| /* |
| * |
| * Copyright (c) 2026 Project CHIP Authors |
| * |
| * Licensed under the Apache License, Version 2.0 (the "License"); |
| * you may not use this file except in compliance with the License. |
| * You may obtain a copy of the License at |
| * |
| * http://www.apache.org/licenses/LICENSE-2.0 |
| * |
| * Unless required by applicable law or agreed to in writing, software |
| * distributed under the License is distributed on an "AS IS" BASIS, |
| * WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied. |
| * See the License for the specific language governing permissions and |
| * limitations under the License. |
| */ |
| |
| #include "PowerSourceClusterTestCommon.h" |
| |
| #include <app/server-cluster/AttributeListBuilder.h> |
| #include <app/server-cluster/testing/ClusterTester.h> |
| #include <app/server-cluster/testing/ValidateGlobalAttributes.h> |
| #include <clusters/PowerSource/Metadata.h> |
| |
| namespace { |
| |
| using namespace chip; |
| using namespace chip::app; |
| using namespace chip::app::Clusters; |
| using namespace chip::app::Clusters::PowerSource; |
| using namespace chip::app::Clusters::PowerSource::Attributes; |
| using namespace chip::Testing; |
| using namespace chip::app::Clusters::PowerSource::TestSupport; |
| |
| struct TestFullBatteryPowerSourceCluster : public TestBase |
| { |
| }; |
| |
| TEST_F(TestFullBatteryPowerSourceCluster, AttributeTest) |
| { |
| FullBatteryPowerSourceConfig config(CharSpan{}, BatReplaceabilityEnum::kUnspecified, timerDelegate); |
| config.MakeReplaceable(CharSpan{}, 0); |
| config.MakeRechargeable(); |
| FullBatteryPowerSourceCluster cluster(kTestEndpointId, config); |
| ASSERT_EQ(cluster.Startup(testContext.Get()), CHIP_NO_ERROR); |
| |
| EXPECT_TRUE(IsAttributesListEqualTo(cluster, |
| { Status::kMetadataEntry, |
| Order::kMetadataEntry, |
| Description::kMetadataEntry, |
| BatVoltage::kMetadataEntry, |
| BatPercentRemaining::kMetadataEntry, |
| BatTimeRemaining::kMetadataEntry, |
| BatChargeLevel::kMetadataEntry, |
| BatReplacementNeeded::kMetadataEntry, |
| BatReplaceability::kMetadataEntry, |
| BatPresent::kMetadataEntry, |
| ActiveBatFaults::kMetadataEntry, |
| BatReplacementDescription::kMetadataEntry, |
| BatCommonDesignation::kMetadataEntry, |
| BatANSIDesignation::kMetadataEntry, |
| BatIECDesignation::kMetadataEntry, |
| BatApprovedChemistry::kMetadataEntry, |
| BatCapacity::kMetadataEntry, |
| BatQuantity::kMetadataEntry, |
| BatChargeState::kMetadataEntry, |
| BatTimeToFullCharge::kMetadataEntry, |
| BatFunctionalWhileCharging::kMetadataEntry, |
| BatChargingCurrent::kMetadataEntry, |
| ActiveBatChargeFaults::kMetadataEntry, |
| EndpointList::kMetadataEntry })); |
| |
| cluster.Shutdown(ClusterShutdownType::kClusterShutdown); |
| } |
| |
| TEST_F(TestFullBatteryPowerSourceCluster, ReadAttributeTest) |
| { |
| FullBatteryPowerSourceConfig config(CharSpan{}, BatReplaceabilityEnum::kUnspecified, timerDelegate); |
| config.MakeReplaceable(CharSpan{}, 0); |
| config.MakeRechargeable(); |
| FullBatteryPowerSourceCluster cluster(kTestEndpointId, config); |
| ASSERT_EQ(cluster.Startup(testContext.Get()), CHIP_NO_ERROR); |
| |
| ClusterTester tester(cluster); |
| ReadAttribute<Status::TypeInfo>(tester); |
| ReadAttribute<Order::TypeInfo>(tester); |
| ReadAttribute<Description::TypeInfo>(tester); |
| ReadAttribute<BatVoltage::TypeInfo>(tester); |
| ReadAttribute<BatPercentRemaining::TypeInfo>(tester); |
| ReadAttribute<BatTimeRemaining::TypeInfo>(tester); |
| ReadAttribute<BatChargeLevel::TypeInfo>(tester); |
| ReadAttribute<BatReplacementNeeded::TypeInfo>(tester); |
| ReadAttribute<BatReplaceability::TypeInfo>(tester); |
| ReadAttribute<BatPresent::TypeInfo>(tester); |
| ReadAttribute<ActiveBatFaults::TypeInfo>(tester); |
| ReadAttribute<BatReplacementDescription::TypeInfo>(tester); |
| ReadAttribute<BatCommonDesignation::TypeInfo>(tester); |
| ReadAttribute<BatANSIDesignation::TypeInfo>(tester); |
| ReadAttribute<BatIECDesignation::TypeInfo>(tester); |
| ReadAttribute<BatApprovedChemistry::TypeInfo>(tester); |
| ReadAttribute<BatCapacity::TypeInfo>(tester); |
| ReadAttribute<BatQuantity::TypeInfo>(tester); |
| ReadAttribute<BatChargeState::TypeInfo>(tester); |
| ReadAttribute<BatTimeToFullCharge::TypeInfo>(tester); |
| ReadAttribute<BatFunctionalWhileCharging::TypeInfo>(tester); |
| ReadAttribute<BatChargingCurrent::TypeInfo>(tester); |
| ReadAttribute<ActiveBatChargeFaults::TypeInfo>(tester); |
| ReadAttribute<EndpointList::TypeInfo>(tester); |
| |
| cluster.Shutdown(ClusterShutdownType::kClusterShutdown); |
| } |
| |
| TEST_F(TestFullBatteryPowerSourceCluster, TestGetters) |
| { |
| FullBatteryPowerSourceConfig config(CharSpan{}, BatReplaceabilityEnum::kUnspecified, timerDelegate); |
| config.MakeReplaceable(CharSpan{}, 0); |
| config.MakeRechargeable(); |
| FullBatteryPowerSourceCluster cluster(kTestEndpointId, config); |
| |
| cluster.GetStatus(); |
| cluster.GetOrder(); |
| cluster.GetDescription(); |
| cluster.GetBatVoltage(); |
| cluster.GetBatPercentRemaining(); |
| cluster.GetBatTimeRemaining(); |
| cluster.GetBatChargeLevel(); |
| cluster.GetBatReplacementNeeded(); |
| cluster.GetBatReplaceability(); |
| cluster.GetBatPresent(); |
| // this will do nothing, because if the buffer is smaller than needed, it will be filled as much as possible. |
| auto noBuf = Span<BatFaultEnum>{}; |
| cluster.GetActiveBatFaults(noBuf); |
| cluster.GetBatReplacementDescription(); |
| cluster.GetBatCommonDesignation(); |
| cluster.GetBatANSIDesignation(); |
| cluster.GetBatIECDesignation(); |
| cluster.GetBatApprovedChemistry(); |
| cluster.GetBatCapacity(); |
| cluster.GetBatQuantity(); |
| cluster.GetBatChargeState(); |
| cluster.GetBatTimeToFullCharge(); |
| cluster.GetBatFunctionalWhileCharging(); |
| cluster.GetBatChargingCurrent(); |
| // this will do nothing, because if the buffer is smaller than needed, it will be filled as much as possible. |
| auto noChargeBuf = Span<BatChargeFaultEnum>{}; |
| cluster.GetActiveBatChargeFaults(noChargeBuf); |
| cluster.GetEndpointList(); |
| } |
| |
| TEST_F(TestFullBatteryPowerSourceCluster, TestSetters) |
| { |
| FullBatteryPowerSourceConfig config(CharSpan{}, BatReplaceabilityEnum::kUnspecified, timerDelegate); |
| config.MakeReplaceable(CharSpan{}, 0); |
| config.MakeRechargeable(); |
| FullBatteryPowerSourceCluster cluster(kTestEndpointId, config); |
| |
| EXPECT_EQ(cluster.SetStatus({}), CHIP_NO_ERROR); |
| cluster.SetOrder({}); |
| cluster.SetBatVoltage({}); |
| EXPECT_EQ(cluster.SetBatPercentRemaining({}), CHIP_NO_ERROR); |
| EXPECT_EQ(cluster.SetBatTimeRemaining({}), CHIP_NO_ERROR); |
| EXPECT_EQ(cluster.SetBatChargeLevel({}), CHIP_NO_ERROR); |
| cluster.SetBatReplacementNeeded({}); |
| cluster.SetBatPresent({}); |
| cluster.SetActiveBatFaults({}); |
| EXPECT_EQ(cluster.SetBatChargeState({}), CHIP_NO_ERROR); |
| EXPECT_EQ(cluster.SetBatTimeToFullCharge({}), CHIP_NO_ERROR); |
| cluster.SetBatFunctionalWhileCharging({}); |
| cluster.SetBatChargingCurrent({}); |
| cluster.SetActiveBatChargeFaults({}); |
| EXPECT_EQ(cluster.SetEndpointList({}), CHIP_NO_ERROR); |
| } |
| |
| TEST_F(TestFullBatteryPowerSourceCluster, TestBounds) |
| { |
| CharSpan longTestText = |
| "Very very long text used for descriptions and designations, totally longer than one hundred bytes. For testing purposes"_span; |
| |
| FullBatteryPowerSourceConfig config(longTestText, BatReplaceabilityEnum::kUnspecified, timerDelegate); |
| config.MakeReplaceable(longTestText, 0); |
| config.MakeRechargeable(); |
| config.batANSIDesignation = longTestText; |
| config.batIECDesignation = longTestText; |
| |
| FullBatteryPowerSourceCluster cluster(kTestEndpointId, config); |
| ClusterTester tester(cluster); |
| TestStringAttributeReadLength<Description::TypeInfo>(tester); |
| TestStringAttributeReadLength<BatReplacementDescription::TypeInfo>(tester); |
| TestStringAttributeReadLength<BatANSIDesignation::TypeInfo>(tester); |
| TestStringAttributeReadLength<BatIECDesignation::TypeInfo>(tester); |
| |
| // Test BatPercentRemaining, which can be only from 0 to 200, or null. |
| |
| EXPECT_EQ(cluster.SetBatPercentRemaining(std::nullopt), CHIP_NO_ERROR); |
| EXPECT_EQ(cluster.SetBatPercentRemaining(uint8_t{ 0 }), CHIP_NO_ERROR); |
| EXPECT_EQ(cluster.SetBatPercentRemaining(uint8_t{ 50 }), CHIP_NO_ERROR); |
| EXPECT_EQ(cluster.SetBatPercentRemaining(uint8_t{ 150 }), CHIP_NO_ERROR); |
| EXPECT_EQ(cluster.SetBatPercentRemaining(uint8_t{ 200 }), CHIP_NO_ERROR); |
| EXPECT_EQ(cluster.SetBatPercentRemaining(uint8_t{ 201 }), CHIP_IM_GLOBAL_STATUS(ConstraintError)); |
| } |
| |
| } // namespace |