blob: 9a1db02b24e78f7819d96d7e3be2f17fe72c2f83 [file] [log] [blame]
# Copyright (c) 2021 Nordic Semiconductor ASA
# SPDX-License-Identifier: Apache-2.0
description: |
Test pin controller.
compatible: "vnd,pinctrl-test"
include: base.yaml
child-binding:
description: |
Test pin controller pin configuration nodes. Each node is composed by one or
more groups, each defining the configuration for a set of pins.
child-binding:
description: |
Test pin controller pin configuration group. Each group contains a list of
pins sharing the same set of properties. Example:
/* node representing default state for test_device0 */
test_device0_default: test_device0_default {
/* group 1 (name is arbitrary) */
group1 {
/* configure pins 0 and 1 */
pins = <0>, <1>;
/* both pins 0 and 1 have pull-up enabled */
bias-pull-up;
};
...
/* group N (name is arbitrary) */
groupN {
/* configure pin M */
pins = <M>;
/* pin M has pull-down enabled */
bias-pull-down;
};
};
The list of supported standard properties:
- bias-pull-up: Enable pull-up resistor.
- bias-pull-down: Enable pull-down resistor.
include:
- name: pincfg-node.yaml
property-allowlist:
- bias-pull-down
- bias-pull-up
properties:
pins:
required: true
type: array
description: |
An array of pins sharing the same group properties. Each entry is a
32-bit integer that is just used to identify the entry for testing
purposes.