| /* |
| * Copyright (c) 2016 Intel Corporation |
| * |
| * SPDX-License-Identifier: Apache-2.0 |
| */ |
| |
| |
| #include <ztest.h> |
| |
| |
| extern void byteorder_test_memcpy_swap(void); |
| extern void byteorder_test_mem_swap(void); |
| extern void atomic_test(void); |
| extern void bitfield_test(void); |
| extern void intmath_test(void); |
| extern void printk_test(void); |
| extern void ring_buffer_test(void); |
| extern void slist_test(void); |
| extern void dlist_test(void); |
| extern void rand32_test(void); |
| extern void timeout_order_test(void); |
| extern void clock_test(void); |
| |
| void test_main(void) |
| { |
| ztest_test_suite(common_test, |
| ztest_unit_test(byteorder_test_memcpy_swap), |
| ztest_unit_test(byteorder_test_mem_swap), |
| ztest_unit_test(atomic_test), |
| #ifdef CONFIG_PRINTK |
| ztest_unit_test(printk_test), |
| #endif |
| ztest_unit_test(ring_buffer_test), |
| ztest_unit_test(slist_test), |
| ztest_unit_test(dlist_test), |
| ztest_unit_test(rand32_test), |
| ztest_unit_test(intmath_test), |
| ztest_unit_test(timeout_order_test), |
| ztest_unit_test(clock_test) |
| ); |
| |
| ztest_run_test_suite(common_test); |
| } |