blob: c7a5ab5aed406b3ff3e9060ab4e84165f4f831c9 [file] [log] [blame]
/*
* Copyright (c) 2018 Nordic Semiconductor ASA.
*
* SPDX-License-Identifier: Apache-2.0
*/
#include <ztest.h>
#include <drivers/flash.h>
#include <device.h>
/* configuration derived from DT */
#ifdef CONFIG_ARCH_POSIX
#define SOC_NV_FLASH_NODE DT_CHILD(DT_INST(0, zephyr_sim_flash), flash_0)
#else
#define SOC_NV_FLASH_NODE DT_CHILD(DT_INST(0, zephyr_sim_flash), flash_sim_0)
#endif /* CONFIG_ARCH_POSIX */
#define FLASH_SIMULATOR_BASE_OFFSET DT_REG_ADDR(SOC_NV_FLASH_NODE)
#define FLASH_SIMULATOR_ERASE_UNIT DT_PROP(SOC_NV_FLASH_NODE, erase_block_size)
#define FLASH_SIMULATOR_PROG_UNIT DT_PROP(SOC_NV_FLASH_NODE, write_block_size)
#define FLASH_SIMULATOR_FLASH_SIZE DT_REG_SIZE(SOC_NV_FLASH_NODE)
#define FLASH_SIMULATOR_ERASE_VALUE \
DT_PROP(DT_PARENT(SOC_NV_FLASH_NODE), erase_value)
/* Offset between pages */
#define TEST_SIM_FLASH_SIZE FLASH_SIMULATOR_FLASH_SIZE
#define TEST_SIM_FLASH_END (TEST_SIM_FLASH_SIZE +\
FLASH_SIMULATOR_BASE_OFFSET)
#define PATTERN8TO32BIT(pat) \
(((((((0xff & pat) << 8) | (0xff & pat)) << 8) | \
(0xff & pat)) << 8) | (0xff & pat))
static const struct device *flash_dev;
static uint8_t test_read_buf[TEST_SIM_FLASH_SIZE];
static uint32_t p32_inc;
void pattern32_ini(uint32_t val)
{
p32_inc = val;
}
static uint32_t pattern32_inc(void)
{
return p32_inc++;
}
static uint32_t pattern32_flat(void)
{
return p32_inc;
}
static void test_check_pattern32(off_t start, uint32_t (*pattern_gen)(void),
size_t size)
{
off_t off;
uint32_t val32, r_val32;
int rc;
for (off = 0; off < size; off += 4) {
rc = flash_read(flash_dev, start + off, &r_val32,
sizeof(r_val32));
zassert_equal(0, rc, "flash_write should succeed");
val32 = pattern_gen();
zassert_equal(val32, r_val32,
"flash word at offset 0x%x has value 0x%08x, " \
"expected 0x%08x",
start + off, r_val32, val32);
}
}
/* Get access to the device and erase it ready for testing*/
static void test_init(void)
{
int rc;
flash_dev = device_get_binding(DT_CHOSEN_ZEPHYR_FLASH_CONTROLLER_LABEL);
zassert_true(flash_dev != NULL,
"Simulated flash driver was not found!");
rc = flash_erase(flash_dev, FLASH_SIMULATOR_BASE_OFFSET,
FLASH_SIMULATOR_FLASH_SIZE);
zassert_equal(0, rc, "flash_erase should succeed");
}
static void test_read(void)
{
off_t i;
int rc;
rc = flash_read(flash_dev, FLASH_SIMULATOR_BASE_OFFSET,
test_read_buf, sizeof(test_read_buf));
zassert_equal(0, rc, "flash_read should succeed");
for (i = 0; i < sizeof(test_read_buf); i++) {
zassert_equal(FLASH_SIMULATOR_ERASE_VALUE,
test_read_buf[i],
"sim flash byte at offset 0x%x has value 0x%08x",
i, test_read_buf[i]);
}
}
static void test_write_read(void)
{
off_t off;
uint32_t val32 = 0, r_val32;
int rc;
for (off = 0; off < TEST_SIM_FLASH_SIZE; off += 4) {
rc = flash_write(flash_dev, FLASH_SIMULATOR_BASE_OFFSET +
off,
&val32, sizeof(val32));
zassert_equal(0, rc,
"flash_write (%d) should succeed at off 0x%x", rc,
FLASH_SIMULATOR_BASE_OFFSET + off);
val32++;
}
val32 = 0;
for (off = 0; off < TEST_SIM_FLASH_SIZE; off += 4) {
rc = flash_read(flash_dev, FLASH_SIMULATOR_BASE_OFFSET +
off,
&r_val32, sizeof(r_val32));
zassert_equal(0, rc, "flash_write should succeed");
zassert_equal(val32, r_val32,
"flash byte at offset 0x%x has value 0x%08x, expected" \
" 0x%08x",
off, r_val32, val32);
val32++;
}
}
static void test_erase(void)
{
int rc;
rc = flash_erase(flash_dev, FLASH_SIMULATOR_BASE_OFFSET +
FLASH_SIMULATOR_ERASE_UNIT,
FLASH_SIMULATOR_ERASE_UNIT);
zassert_equal(0, rc, "flash_erase should succeed");
TC_PRINT("Incremental pattern expected\n");
pattern32_ini(0);
test_check_pattern32(FLASH_SIMULATOR_BASE_OFFSET, pattern32_inc,
FLASH_SIMULATOR_ERASE_UNIT);
TC_PRINT("Erased area expected\n");
pattern32_ini(PATTERN8TO32BIT(FLASH_SIMULATOR_ERASE_VALUE));
test_check_pattern32(FLASH_SIMULATOR_BASE_OFFSET +
FLASH_SIMULATOR_ERASE_UNIT, pattern32_flat,
FLASH_SIMULATOR_ERASE_UNIT);
TC_PRINT("Incremental pattern expected\n");
pattern32_ini(FLASH_SIMULATOR_ERASE_UNIT*2 /
FLASH_SIMULATOR_PROG_UNIT);
test_check_pattern32(FLASH_SIMULATOR_BASE_OFFSET +
FLASH_SIMULATOR_ERASE_UNIT*2, pattern32_inc,
FLASH_SIMULATOR_ERASE_UNIT*2);
}
static void test_out_of_bounds(void)
{
int rc;
uint8_t data[8] = {0};
rc = flash_write(flash_dev, FLASH_SIMULATOR_BASE_OFFSET - 4,
data, 4);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_write(flash_dev, FLASH_SIMULATOR_BASE_OFFSET - 4,
data, 8);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_write(flash_dev, TEST_SIM_FLASH_END,
data, 4);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_write(flash_dev, TEST_SIM_FLASH_END - 4,
data, 8);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_erase(flash_dev, FLASH_SIMULATOR_BASE_OFFSET -
FLASH_SIMULATOR_ERASE_UNIT,
FLASH_SIMULATOR_ERASE_UNIT);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_erase(flash_dev, TEST_SIM_FLASH_END,
FLASH_SIMULATOR_ERASE_UNIT);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_erase(flash_dev, FLASH_SIMULATOR_BASE_OFFSET -
FLASH_SIMULATOR_ERASE_UNIT*2,
FLASH_SIMULATOR_ERASE_UNIT*2);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_erase(flash_dev, TEST_SIM_FLASH_END -
FLASH_SIMULATOR_ERASE_UNIT,
FLASH_SIMULATOR_ERASE_UNIT*2);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_read(flash_dev, FLASH_SIMULATOR_BASE_OFFSET - 4,
data, 4);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_read(flash_dev, FLASH_SIMULATOR_BASE_OFFSET - 4,
data, 8);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_read(flash_dev, TEST_SIM_FLASH_END,
data, 4);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_read(flash_dev, TEST_SIM_FLASH_END - 4, data, 8);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
}
static void test_align(void)
{
int rc;
uint8_t data[4] = {0};
rc = flash_read(flash_dev, FLASH_SIMULATOR_BASE_OFFSET + 1,
data, 4);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_write(flash_dev, FLASH_SIMULATOR_BASE_OFFSET + 1,
data, 4);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_write(flash_dev, FLASH_SIMULATOR_BASE_OFFSET,
data, 3);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_erase(flash_dev, FLASH_SIMULATOR_BASE_OFFSET + 1,
FLASH_SIMULATOR_ERASE_UNIT);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
rc = flash_erase(flash_dev, FLASH_SIMULATOR_BASE_OFFSET,
FLASH_SIMULATOR_ERASE_UNIT + 1);
zassert_equal(-EINVAL, rc, "Unexpected error code (%d)", rc);
}
static void test_double_write(void)
{
int rc;
/* Test checks behaviour of write when attempting to double write
* selected offset. Simulator, prior to write, checks if selected
* memory contains erased values and returns -EIO if not; data has
* to be initialized to value that will not be equal to erase
* value of flash, for this test.
*/
uint32_t data = ~(PATTERN8TO32BIT(FLASH_SIMULATOR_ERASE_VALUE));
rc = flash_erase(flash_dev, FLASH_SIMULATOR_BASE_OFFSET,
FLASH_SIMULATOR_ERASE_UNIT);
zassert_equal(0, rc, "flash_erase should succeed");
rc = flash_write(flash_dev, FLASH_SIMULATOR_BASE_OFFSET,
&data, sizeof(data));
zassert_equal(0, rc, "flash_write should succedd");
rc = flash_write(flash_dev, FLASH_SIMULATOR_BASE_OFFSET,
&data, sizeof(data));
zassert_equal(-EIO, rc, "Unexpected error code (%d)", rc);
}
static void test_get_erase_value(void)
{
const struct flash_parameters *fp = flash_get_parameters(flash_dev);
zassert_equal(fp->erase_value, FLASH_SIMULATOR_ERASE_VALUE,
"Expected erase value %x",
FLASH_SIMULATOR_ERASE_VALUE);
}
void test_main(void)
{
ztest_test_suite(flash_sim_api,
ztest_unit_test(test_init),
ztest_unit_test(test_read),
ztest_unit_test(test_write_read),
ztest_unit_test(test_erase),
ztest_unit_test(test_out_of_bounds),
ztest_unit_test(test_align),
ztest_unit_test(test_get_erase_value),
ztest_unit_test(test_double_write));
ztest_run_test_suite(flash_sim_api);
}