blob: 2b7804963d06f40f29a1d7930f9f0ab5623673e0 [file] [log] [blame]
/*
* Copyright (c) 2020 Teslabs Engineering S.L.
*
* SPDX-License-Identifier: Apache-2.0
*/
#include <zephyr.h>
#include <ztest.h>
/** Buffer size. */
#define BUF_SIZE 64U
/**
* @brief Helper function to test SDRAM r/w.
*
* @param mem SDRAM memory location to be tested.
*/
static void test_sdram_rw(uint32_t *mem)
{
/* fill memory with number range (0, BUF_SIZE - 1) */
for (size_t i = 0U; i < BUF_SIZE; i++) {
mem[i] = i;
}
/* check that memory contains written range */
for (size_t i = 0U; i < BUF_SIZE; i++) {
zassert_equal(mem[i], i, "Unexpected content");
}
}
#if DT_NODE_HAS_STATUS(DT_NODELABEL(sdram1), okay)
/** Buffer on SDRAM1. */
__stm32_sdram1_section uint32_t sdram1[BUF_SIZE];
static void test_sdram1_rw(void)
{
test_sdram_rw(sdram1);
}
#else
static void test_sdram1_rw(void)
{
ztest_test_skip();
}
#endif
#if DT_NODE_HAS_STATUS(DT_NODELABEL(sdram2), okay)
/** Buffer on SDRAM2. */
__stm32_sdram2_section uint32_t sdram2[BUF_SIZE];
static void test_sdram2_rw(void)
{
test_sdram_rw(sdram2);
}
#else
static void test_sdram2_rw(void)
{
ztest_test_skip();
}
#endif
void test_main(void)
{
ztest_test_suite(stm32_sdram,
ztest_unit_test(test_sdram1_rw),
ztest_unit_test(test_sdram2_rw));
ztest_run_test_suite(stm32_sdram);
}