blob: b29cd9ce6ca6fe225514f9c5ada3e72f3230d089 [file] [log] [blame]
/*
* Copyright (c) 2016 Intel Corporation.
*
* SPDX-License-Identifier: Apache-2.0
*/
#include <zephyr/kernel.h>
#include <zephyr/drivers/flash.h>
#include <zephyr/device.h>
#include <zephyr/devicetree.h>
#include <stdio.h>
#include <string.h>
#if defined(CONFIG_BOARD_ADAFRUIT_FEATHER_STM32F405)
#define SPI_FLASH_TEST_REGION_OFFSET 0xf000
#elif defined(CONFIG_BOARD_ARTY_A7_ARM_DESIGNSTART_M1) || \
defined(CONFIG_BOARD_ARTY_A7_ARM_DESIGNSTART_M3)
/* The FPGA bitstream is stored in the lower 536 sectors of the flash. */
#define SPI_FLASH_TEST_REGION_OFFSET \
DT_REG_SIZE(DT_NODE_BY_FIXED_PARTITION_LABEL(fpga_bitstream))
#elif defined(CONFIG_BOARD_NPCX9M6F_EVB) || \
defined(CONFIG_BOARD_NPCX7M6FB_EVB)
#define SPI_FLASH_TEST_REGION_OFFSET 0x7F000
#else
#define SPI_FLASH_TEST_REGION_OFFSET 0xff000
#endif
#define SPI_FLASH_SECTOR_SIZE 4096
#if defined(CONFIG_FLASH_STM32_OSPI) || defined(CONFIG_FLASH_STM32_QSPI)
#define SPI_FLASH_MULTI_SECTOR_TEST
#endif
const uint8_t erased[] = { 0xff, 0xff, 0xff, 0xff };
void single_sector_test(const struct device *flash_dev)
{
const uint8_t expected[] = { 0x55, 0xaa, 0x66, 0x99 };
const size_t len = sizeof(expected);
uint8_t buf[sizeof(expected)];
int rc;
printf("\nPerform test on single sector");
/* Write protection needs to be disabled before each write or
* erase, since the flash component turns on write protection
* automatically after completion of write and erase
* operations.
*/
printf("\nTest 1: Flash erase\n");
/* Full flash erase if SPI_FLASH_TEST_REGION_OFFSET = 0 and
* SPI_FLASH_SECTOR_SIZE = flash size
*/
rc = flash_erase(flash_dev, SPI_FLASH_TEST_REGION_OFFSET,
SPI_FLASH_SECTOR_SIZE);
if (rc != 0) {
printf("Flash erase failed! %d\n", rc);
} else {
/* Check erased pattern */
memset(buf, 0, len);
rc = flash_read(flash_dev, SPI_FLASH_TEST_REGION_OFFSET, buf, len);
if (rc != 0) {
printf("Flash read failed! %d\n", rc);
return;
}
if (memcmp(erased, buf, len) != 0) {
printf("Flash erase failed at offset 0x%x got 0x%x\n",
SPI_FLASH_TEST_REGION_OFFSET, *(uint32_t *)buf);
return;
}
printf("Flash erase succeeded!\n");
}
printf("\nTest 2: Flash write\n");
printf("Attempting to write %zu bytes\n", len);
rc = flash_write(flash_dev, SPI_FLASH_TEST_REGION_OFFSET, expected, len);
if (rc != 0) {
printf("Flash write failed! %d\n", rc);
return;
}
memset(buf, 0, len);
rc = flash_read(flash_dev, SPI_FLASH_TEST_REGION_OFFSET, buf, len);
if (rc != 0) {
printf("Flash read failed! %d\n", rc);
return;
}
if (memcmp(expected, buf, len) == 0) {
printf("Data read matches data written. Good!!\n");
} else {
const uint8_t *wp = expected;
const uint8_t *rp = buf;
const uint8_t *rpe = rp + len;
printf("Data read does not match data written!!\n");
while (rp < rpe) {
printf("%08x wrote %02x read %02x %s\n",
(uint32_t)(SPI_FLASH_TEST_REGION_OFFSET + (rp - buf)),
*wp, *rp, (*rp == *wp) ? "match" : "MISMATCH");
++rp;
++wp;
}
}
}
#if defined SPI_FLASH_MULTI_SECTOR_TEST
void multi_sector_test(const struct device *flash_dev)
{
const uint8_t expected[] = { 0x55, 0xaa, 0x66, 0x99 };
const size_t len = sizeof(expected);
uint8_t buf[sizeof(expected)];
int rc;
printf("\nPerform test on multiple consecutive sectors");
/* Write protection needs to be disabled before each write or
* erase, since the flash component turns on write protection
* automatically after completion of write and erase
* operations.
*/
printf("\nTest 1: Flash erase\n");
/* Full flash erase if SPI_FLASH_TEST_REGION_OFFSET = 0 and
* SPI_FLASH_SECTOR_SIZE = flash size
* Erase 2 sectors for check for erase of consequtive sectors
*/
rc = flash_erase(flash_dev, SPI_FLASH_TEST_REGION_OFFSET, SPI_FLASH_SECTOR_SIZE * 2);
if (rc != 0) {
printf("Flash erase failed! %d\n", rc);
} else {
/* Read the content and check for erased */
memset(buf, 0, len);
size_t offs = SPI_FLASH_TEST_REGION_OFFSET;
while (offs < SPI_FLASH_TEST_REGION_OFFSET + 2 * SPI_FLASH_SECTOR_SIZE) {
rc = flash_read(flash_dev, offs, buf, len);
if (rc != 0) {
printf("Flash read failed! %d\n", rc);
return;
}
if (memcmp(erased, buf, len) != 0) {
printf("Flash erase failed at offset 0x%x got 0x%x\n",
offs, *(uint32_t *)buf);
return;
}
offs += SPI_FLASH_SECTOR_SIZE;
}
printf("Flash erase succeeded!\n");
}
printf("\nTest 2: Flash write\n");
size_t offs = SPI_FLASH_TEST_REGION_OFFSET;
while (offs < SPI_FLASH_TEST_REGION_OFFSET + 2 * SPI_FLASH_SECTOR_SIZE) {
printf("Attempting to write %zu bytes at offset 0x%x\n", len, offs);
rc = flash_write(flash_dev, offs, expected, len);
if (rc != 0) {
printf("Flash write failed! %d\n", rc);
return;
}
memset(buf, 0, len);
rc = flash_read(flash_dev, offs, buf, len);
if (rc != 0) {
printf("Flash read failed! %d\n", rc);
return;
}
if (memcmp(expected, buf, len) == 0) {
printf("Data read matches data written. Good!!\n");
} else {
const uint8_t *wp = expected;
const uint8_t *rp = buf;
const uint8_t *rpe = rp + len;
printf("Data read does not match data written!!\n");
while (rp < rpe) {
printf("%08x wrote %02x read %02x %s\n",
(uint32_t)(offs + (rp - buf)),
*wp, *rp, (*rp == *wp) ? "match" : "MISMATCH");
++rp;
++wp;
}
}
offs += SPI_FLASH_SECTOR_SIZE;
}
}
#endif
int main(void)
{
const struct device *flash_dev = DEVICE_DT_GET(DT_ALIAS(spi_flash0));
if (!device_is_ready(flash_dev)) {
printk("%s: device not ready.\n", flash_dev->name);
return 0;
}
printf("\n%s SPI flash testing\n", flash_dev->name);
printf("==========================\n");
single_sector_test(flash_dev);
#if defined SPI_FLASH_MULTI_SECTOR_TEST
multi_sector_test(flash_dev);
#endif
return 0;
}